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Overview Leadership Blog JoVE Help Center

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Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

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Testimonials Subscriptions Access Resources Library Advisory Board FAQ

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JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

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B D Hoskins

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APL Materials|April 16, 2019

Electron beam-based metrology after CMOSJ A Liddle, B D Hoskins, A E Vladár, et al.

Nature|May 8, 2015

Training and operation of an integrated neuromorphic network based on metal-oxide memristorsM Prezioso, F Merrikh-Bayat, B D Hoskins, et al.

Applied Physics Letters|March 6, 2023

Impact ionization-induced bistability in CMOS transistors at cryogenic temperatures for capacitorless memory applicationsA Zaslavsky, C A Richter, P R Shrestha, et al.

Pageof 1

Search research articles

Showing results (1-10 of 3) with videos related to

Sort By:

Pageof 1

APL Materials|April 16, 2019

Electron beam-based metrology after CMOSJ A Liddle, B D Hoskins, A E Vladár, et al.

Nature|May 8, 2015

Training and operation of an integrated neuromorphic network based on metal-oxide memristorsM Prezioso, F Merrikh-Bayat, B D Hoskins, et al.

Applied Physics Letters|March 6, 2023

Impact ionization-induced bistability in CMOS transistors at cryogenic temperatures for capacitorless memory applicationsA Zaslavsky, C A Richter, P R Shrestha, et al.

Pageof 1