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B D Wissman

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Chaos (Woodbury, N.Y.)|April 8, 2010
Geometry of repeated measurements in chaotic systemsP-M Binder, B D Wissman
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|December 21, 2011
Entropy rate estimates from mutual informationB D Wissman, L C McKay-Jones, P-M Binder
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 14, 2001
Advances in Atom Probe Specimen Fabrication from Planar Multilayer Thin Film StructuresD J. Larson, B D. Wissman, R L. Martens, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Chaos (Woodbury, N.Y.)|April 8, 2010
Geometry of repeated measurements in chaotic systemsP-M Binder, B D Wissman
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|December 21, 2011
Entropy rate estimates from mutual informationB D Wissman, L C McKay-Jones, P-M Binder
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 14, 2001
Advances in Atom Probe Specimen Fabrication from Planar Multilayer Thin Film StructuresD J. Larson, B D. Wissman, R L. Martens, et al.
Pageof 1