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B J Stagg

Showing results (1-10 of 6) with videos related to

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Applied Optics|October 2, 2010
High-temperature ellipsometer system to determine the optical properties of materialsT T Charalampopoulos, B J Stagg
Applied Optics|October 2, 2010
Source-optics polarization effects on ellipsometry analysisB J Stagg, T T Charalampopoulos
Applied Optics|August 14, 2010
Surface-roughness effects on the determination of optical properties of materials by the reflection methodB J Stagg, T T Charalampopoulos
Applied Optics|June 26, 2010
Method to minimize the effects of polarizer leakage on reflectivity measurementsB J Stagg, T T Charalampopoulos
Applied Optics|August 21, 2010
Sensitivity of the reflection technique: optimum angles of incidence to determine the optical properties of materialsB J Stagg, T T Charalampopoulos
Applied Optics|August 20, 2010
Method for azimuthal alignment in fixed-angle ellipsometryB J Stagg, T T Charalampopoulos
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Applied Optics|October 2, 2010
High-temperature ellipsometer system to determine the optical properties of materialsT T Charalampopoulos, B J Stagg
Applied Optics|October 2, 2010
Source-optics polarization effects on ellipsometry analysisB J Stagg, T T Charalampopoulos
Applied Optics|August 14, 2010
Surface-roughness effects on the determination of optical properties of materials by the reflection methodB J Stagg, T T Charalampopoulos
Applied Optics|June 26, 2010
Method to minimize the effects of polarizer leakage on reflectivity measurementsB J Stagg, T T Charalampopoulos
Applied Optics|August 21, 2010
Sensitivity of the reflection technique: optimum angles of incidence to determine the optical properties of materialsB J Stagg, T T Charalampopoulos
Applied Optics|August 20, 2010
Method for azimuthal alignment in fixed-angle ellipsometryB J Stagg, T T Charalampopoulos
Pageof 1