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B M Jablon

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Journal of Microscopy|January 31, 2020

Improving EBSD precision by orientation refinement with full pattern matchingA Winkelmann, B M Jablon, V S Tong, et al.

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Search research articles

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Journal of Microscopy|January 31, 2020

Improving EBSD precision by orientation refinement with full pattern matchingA Winkelmann, B M Jablon, V S Tong, et al.

Pageof 1