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Journal of Applied Crystallography|June 20, 2015
McSAS: software for the retrieval of model parameter distributions from scattering patternsI Bressler, B R Pauw, A F ThünemannJournal of Applied Crystallography|December 9, 2017
The modular small-angle X-ray scattering data correction sequenceB R Pauw, A J Smith, T Snow, et al.Pageof 1