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B Titze
W Denk

Journal of microscopy

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Journal of Microscopy|March 5, 2013
Automated in-chamber specimen coating for serial block-face electron microscopyB Titze, W Denk
Journal of Microscopy|October 11, 2013
Controlling FIB-SBEM slice thickness by monitoring the transmitted ion beamK M Boergens, W Denk
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Journal of Microscopy|March 5, 2013
Automated in-chamber specimen coating for serial block-face electron microscopyB Titze, W Denk
Journal of Microscopy|October 11, 2013
Controlling FIB-SBEM slice thickness by monitoring the transmitted ion beamK M Boergens, W Denk
Pageof 1