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Journal of Microscopy
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March 16, 2017
Investigation of fatigue crack initiation facets in Ti-6Al-4V using focused ion beam milling and electron backscatter diffraction
J Everaerts, B Verlinden, M Wevers
Communications in Agricultural and Applied Biological Sciences
|
December 22, 2005
Virtual tissue generation of fruit tissue using Voronoi tessellations
H K Mebatsion, P Verboven, B Verlinden, et al.
Journal of Microscopy
|
April 29, 2005
Visualization of grain subdivision by analysing the misorientations within a grain using electron backscatter diffraction
S Van Boxel, M Seefeldt, B Verlinden, et al.
Journal of Microscopy
|
January 11, 2007
Electron backscatter diffraction on pearlite structures in steel
A Walentek, M Seefeldt, B Verlinden, et al.
Dental Materials : Official Publication of the Academy of Dental Materials
|
July 15, 2009
Ultrastructural characterization of tooth-biomaterial interfaces prepared with broad and focused ion beams
E Coutinho, T Jarmar, F Svahn, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Journal of Microscopy
|
March 16, 2017
Investigation of fatigue crack initiation facets in Ti-6Al-4V using focused ion beam milling and electron backscatter diffraction
J Everaerts, B Verlinden, M Wevers
Communications in Agricultural and Applied Biological Sciences
|
December 22, 2005
Virtual tissue generation of fruit tissue using Voronoi tessellations
H K Mebatsion, P Verboven, B Verlinden, et al.
Journal of Microscopy
|
April 29, 2005
Visualization of grain subdivision by analysing the misorientations within a grain using electron backscatter diffraction
S Van Boxel, M Seefeldt, B Verlinden, et al.
Journal of Microscopy
|
January 11, 2007
Electron backscatter diffraction on pearlite structures in steel
A Walentek, M Seefeldt, B Verlinden, et al.
Dental Materials : Official Publication of the Academy of Dental Materials
|
July 15, 2009
Ultrastructural characterization of tooth-biomaterial interfaces prepared with broad and focused ion beams
E Coutinho, T Jarmar, F Svahn, et al.
Page
of 1