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Balaji Raghothamachar

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Microscopy Research and Technique|April 29, 2006
Defect analysis in crystals using X-ray topographyBalaji Raghothamachar, Govindhan Dhanaraj, Jie Bai, et al.
Journal of Applied Crystallography|October 4, 2023
Upgraded <i>LauePt4</i> for rapid recognition and fitting of Laue patterns from crystals with unknown orientationsVincent W Huang, Yafei Liu, Balaji Raghothamachar, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Microscopy Research and Technique|April 29, 2006
Defect analysis in crystals using X-ray topographyBalaji Raghothamachar, Govindhan Dhanaraj, Jie Bai, et al.
Journal of Applied Crystallography|October 4, 2023
Upgraded <i>LauePt4</i> for rapid recognition and fitting of Laue patterns from crystals with unknown orientationsVincent W Huang, Yafei Liu, Balaji Raghothamachar, et al.
Pageof 1