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Applied Optics|March 20, 2002
Spatially modulated illumination microscopy allows axial distance resolution in the nanometer rangeBenno Albrecht, Antonio Virgilio Failla, Andreas Schweitzer, et al.
Applied Optics|December 13, 2002
Nanosizing of fluorescent objects by spatially modulated illumination microscopyAntonio Virgillo Failla, Udo Spoeri, Benno Albrecht, et al.
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