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Bernhard Schaffer

Showing results (1-10 of 12) with videos related to

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Micron (Oxford, England : 1993)|April 16, 2003
Width determination of SiO2-films in Si-based devices using low-loss EFTEM: image contrast as a function of sample thicknessBernhard Schaffer, Werner Grogger, Ferdinand Hofer
Ultramicroscopy|November 24, 2004
Automated spatial drift correction for EFTEM image seriesBernhard Schaffer, Werner Grogger, Gerald Kothleitner
Ultramicroscopy|July 29, 2006
EFTEM spectrum imaging at high-energy resolutionBernhard Schaffer, Gerald Kothleitner, Werner Grogger
Ultramicroscopy|February 24, 2012
Sample preparation for atomic-resolution STEM at low voltages by FIBMiroslava Schaffer, Bernhard Schaffer, Quentin Ramasse
Analytical and Bioanalytical Chemistry|September 18, 2007
Application of high-resolution EFTEM SI in an AEMBernhard Schaffer, Werner Grogger, Gerald Kothleitner, et al.
Ultramicroscopy|July 23, 2003
Energy-filtering TEM at high magnification: spatial resolution and detection limitsWerner Grogger, Bernhard Schaffer, Kannan M Krishnan, et al.
Ultramicroscopy|February 3, 2007
Automated three-dimensional X-ray analysis using a dual-beam FIBMiroslava Schaffer, Julian Wagner, Bernhard Schaffer, et al.
Physical Review Letters|March 10, 2012
Direct insight into grain boundary reconstruction in polycrystalline Cu(In,Ga)SE2 with atomic resolutionDaniel Abou-Ras, Bernhard Schaffer, Miroslava Schaffer, et al.
Ultramicroscopy|April 8, 2025
Splicing dual-range EELS spectra: Identifying and correcting artefactsAlan J Craven, Bianca Sala, Donald A MacLaren, et al.
Ultramicroscopy|September 29, 2004
Cross-section analysis of organic light-emitting diodesBernhard Schaffer, Christoph Mitterbauer, Andreas Schertel, et al.
Pageof 2

Showing results (1-10 of 12) with videos related to

Sort By:
Pageof 2
Micron (Oxford, England : 1993)|April 16, 2003
Width determination of SiO2-films in Si-based devices using low-loss EFTEM: image contrast as a function of sample thicknessBernhard Schaffer, Werner Grogger, Ferdinand Hofer
Ultramicroscopy|November 24, 2004
Automated spatial drift correction for EFTEM image seriesBernhard Schaffer, Werner Grogger, Gerald Kothleitner
Ultramicroscopy|July 29, 2006
EFTEM spectrum imaging at high-energy resolutionBernhard Schaffer, Gerald Kothleitner, Werner Grogger
Ultramicroscopy|February 24, 2012
Sample preparation for atomic-resolution STEM at low voltages by FIBMiroslava Schaffer, Bernhard Schaffer, Quentin Ramasse
Analytical and Bioanalytical Chemistry|September 18, 2007
Application of high-resolution EFTEM SI in an AEMBernhard Schaffer, Werner Grogger, Gerald Kothleitner, et al.
Ultramicroscopy|July 23, 2003
Energy-filtering TEM at high magnification: spatial resolution and detection limitsWerner Grogger, Bernhard Schaffer, Kannan M Krishnan, et al.
Ultramicroscopy|February 3, 2007
Automated three-dimensional X-ray analysis using a dual-beam FIBMiroslava Schaffer, Julian Wagner, Bernhard Schaffer, et al.
Physical Review Letters|March 10, 2012
Direct insight into grain boundary reconstruction in polycrystalline Cu(In,Ga)SE2 with atomic resolutionDaniel Abou-Ras, Bernhard Schaffer, Miroslava Schaffer, et al.
Ultramicroscopy|April 8, 2025
Splicing dual-range EELS spectra: Identifying and correcting artefactsAlan J Craven, Bianca Sala, Donald A MacLaren, et al.
Ultramicroscopy|September 29, 2004
Cross-section analysis of organic light-emitting diodesBernhard Schaffer, Christoph Mitterbauer, Andreas Schertel, et al.
Pageof 2