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Bert Voigtländer

Showing results (1-10 of 21) with videos related to

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The Review of Scientific Instruments|April 8, 2010
Simultaneously measured signals in scanning probe microscopy with a needle sensor: frequency shift and tunneling currentIreneusz Morawski, Bert Voigtländer
The Review of Scientific Instruments|March 3, 2012
A nanopositioner for scanning probe microscopy: the KoalaDriveVasily Cherepanov, Peter Coenen, Bert Voigtländer
Physical Review Letters|October 2, 2009
Nanoscale pit formation at 2D Ge layers on Si: influence of energy and entropyKonstantin Romanyuk, Jacek Brona, Bert Voigtländer
The Review of Scientific Instruments|July 5, 2011
Voltage preamplifier for extensional quartz sensors used in scanning force microscopyIreneusz Morawski, Józef Blicharski, Bert Voigtländer
Physical Review Letters|October 13, 2007
Symmetry breaking in the growth of two-dimensional islands on Si(111)Konstantin Romanyuk, Vasily Cherepanov, Bert Voigtländer
The Review of Scientific Instruments|April 2, 2008
Metal bead crystals for easy heating by direct currentBert Voigtländer, Vasily Cherepanov, Christa Elsaesser, et al.
Physical Review Letters|October 4, 2003
Nanowires and nanorings at the atomic levelMidori Kawamura, Neelima Paul, Vasily Cherepanov, et al.
The Review of Scientific Instruments|January 3, 2016
Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applicationsIreneusz Morawski, Richard Spiegelberg, Stefan Korte, et al.
The Review of Scientific Instruments|February 2, 2022
Nanoscale tip positioning with a multi-tip scanning tunneling microscope using topography imagesArthur Leis, Vasily Cherepanov, Bert Voigtländer, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|December 21, 2017
Four-point probe measurements using current probes with voltage feedback to measure electric potentialsFelix Lüpke, David Cuma, Stefan Korte, et al.
Pageof 3

Showing results (1-10 of 21) with videos related to

Sort By:
Pageof 3
The Review of Scientific Instruments|April 8, 2010
Simultaneously measured signals in scanning probe microscopy with a needle sensor: frequency shift and tunneling currentIreneusz Morawski, Bert Voigtländer
The Review of Scientific Instruments|March 3, 2012
A nanopositioner for scanning probe microscopy: the KoalaDriveVasily Cherepanov, Peter Coenen, Bert Voigtländer
Physical Review Letters|October 2, 2009
Nanoscale pit formation at 2D Ge layers on Si: influence of energy and entropyKonstantin Romanyuk, Jacek Brona, Bert Voigtländer
The Review of Scientific Instruments|July 5, 2011
Voltage preamplifier for extensional quartz sensors used in scanning force microscopyIreneusz Morawski, Józef Blicharski, Bert Voigtländer
Physical Review Letters|October 13, 2007
Symmetry breaking in the growth of two-dimensional islands on Si(111)Konstantin Romanyuk, Vasily Cherepanov, Bert Voigtländer
The Review of Scientific Instruments|April 2, 2008
Metal bead crystals for easy heating by direct currentBert Voigtländer, Vasily Cherepanov, Christa Elsaesser, et al.
Physical Review Letters|October 4, 2003
Nanowires and nanorings at the atomic levelMidori Kawamura, Neelima Paul, Vasily Cherepanov, et al.
The Review of Scientific Instruments|January 3, 2016
Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applicationsIreneusz Morawski, Richard Spiegelberg, Stefan Korte, et al.
The Review of Scientific Instruments|February 2, 2022
Nanoscale tip positioning with a multi-tip scanning tunneling microscope using topography imagesArthur Leis, Vasily Cherepanov, Bert Voigtländer, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|December 21, 2017
Four-point probe measurements using current probes with voltage feedback to measure electric potentialsFelix Lüpke, David Cuma, Stefan Korte, et al.
Pageof 3