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The Review of Scientific Instruments
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March 19, 2025
A contact probe based on multi-focus spectral confocal method for in-site measurement of form and position errors of complex surface workpieces
Bing Yu, Qiang Ru, Anyu Sun, et al.
The Review of Scientific Instruments
|
April 9, 2020
A new method for detecting surface defects on curved reflective optics using normalized reflectivity
Hui-Lin Du, Wen-Hao Zhang, Bing-Feng Ju, et al.
Ultrasonics
|
February 6, 2018
Numerical and experimental analysis of a focused reflected wave in a multi-layered material based on a ray model
Xiaoyu Yang, Chengcheng Zhang, Anyu Sun, et al.
Ultrasonics
|
August 22, 2018
Simultaneous ultrasonic parameter estimation of a multi-layered material by the PSO-based least squares algorithm using the reflection spectrum
Xiaoyu Yang, Chengcheng Zhang, Chuanyong Wang, et al.
Science Advances
|
February 28, 2025
Pixel-level metal blackbody microcavities via hierarchical laser writing
Chong-Kuong Ng, Tianle Chen, Bing-Feng Ju, et al.
The Review of Scientific Instruments
|
June 7, 2012
Note: long range and accurate measurement of deep trench microstructures by a specialized scanning tunneling microscope
Bing-Feng Ju, Yuan-Liu Chen, Wei Zhang, et al.
The Review of Scientific Instruments
|
July 10, 2021
All-optical laser-ultrasonic technology for width and depth gauging of rectangular surface-breaking defects
Cheng Chen, Bing-Feng Ju, Xiaoyu Yang, et al.
Sensors (Basel, Switzerland)
|
November 25, 2023
Novel Information-Driven Smoothing Spline Linearization Method for High-Precision Displacement Sensors Based on Information Criterions
Wen-Hao Zhang, Lin Dai, Wang Chen, et al.
The Review of Scientific Instruments
|
July 3, 2017
Full area covered 3D profile measurement of special-shaped optics based on a new prototype non-contact profiler
Hui-Lin Du, Zhao-Zhong Zhou, Ze-Qing Sun, et al.
Communications Engineering
|
September 12, 2024
Multi-view neural 3D reconstruction of micro- and nanostructures with atomic force microscopy
Shuo Chen, Mao Peng, Yijin Li, et al.
Page
of 4
Search research articles
Search
Showing results (21-30 of 36) with videos related to
Sort By:
Page
of 4
The Review of Scientific Instruments
|
March 19, 2025
A contact probe based on multi-focus spectral confocal method for in-site measurement of form and position errors of complex surface workpieces
Bing Yu, Qiang Ru, Anyu Sun, et al.
The Review of Scientific Instruments
|
April 9, 2020
A new method for detecting surface defects on curved reflective optics using normalized reflectivity
Hui-Lin Du, Wen-Hao Zhang, Bing-Feng Ju, et al.
Ultrasonics
|
February 6, 2018
Numerical and experimental analysis of a focused reflected wave in a multi-layered material based on a ray model
Xiaoyu Yang, Chengcheng Zhang, Anyu Sun, et al.
Ultrasonics
|
August 22, 2018
Simultaneous ultrasonic parameter estimation of a multi-layered material by the PSO-based least squares algorithm using the reflection spectrum
Xiaoyu Yang, Chengcheng Zhang, Chuanyong Wang, et al.
Science Advances
|
February 28, 2025
Pixel-level metal blackbody microcavities via hierarchical laser writing
Chong-Kuong Ng, Tianle Chen, Bing-Feng Ju, et al.
The Review of Scientific Instruments
|
June 7, 2012
Note: long range and accurate measurement of deep trench microstructures by a specialized scanning tunneling microscope
Bing-Feng Ju, Yuan-Liu Chen, Wei Zhang, et al.
The Review of Scientific Instruments
|
July 10, 2021
All-optical laser-ultrasonic technology for width and depth gauging of rectangular surface-breaking defects
Cheng Chen, Bing-Feng Ju, Xiaoyu Yang, et al.
Sensors (Basel, Switzerland)
|
November 25, 2023
Novel Information-Driven Smoothing Spline Linearization Method for High-Precision Displacement Sensors Based on Information Criterions
Wen-Hao Zhang, Lin Dai, Wang Chen, et al.
The Review of Scientific Instruments
|
July 3, 2017
Full area covered 3D profile measurement of special-shaped optics based on a new prototype non-contact profiler
Hui-Lin Du, Zhao-Zhong Zhou, Ze-Qing Sun, et al.
Communications Engineering
|
September 12, 2024
Multi-view neural 3D reconstruction of micro- and nanostructures with atomic force microscopy
Shuo Chen, Mao Peng, Yijin Li, et al.
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of 4