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Bing-Feng Ju

Showing results (21-30 of 36) with videos related to

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The Review of Scientific Instruments|March 19, 2025
A contact probe based on multi-focus spectral confocal method for in-site measurement of form and position errors of complex surface workpiecesBing Yu, Qiang Ru, Anyu Sun, et al.
The Review of Scientific Instruments|April 9, 2020
A new method for detecting surface defects on curved reflective optics using normalized reflectivityHui-Lin Du, Wen-Hao Zhang, Bing-Feng Ju, et al.
Ultrasonics|February 6, 2018
Numerical and experimental analysis of a focused reflected wave in a multi-layered material based on a ray modelXiaoyu Yang, Chengcheng Zhang, Anyu Sun, et al.
Ultrasonics|August 22, 2018
Simultaneous ultrasonic parameter estimation of a multi-layered material by the PSO-based least squares algorithm using the reflection spectrumXiaoyu Yang, Chengcheng Zhang, Chuanyong Wang, et al.
Science Advances|February 28, 2025
Pixel-level metal blackbody microcavities via hierarchical laser writingChong-Kuong Ng, Tianle Chen, Bing-Feng Ju, et al.
The Review of Scientific Instruments|June 7, 2012
Note: long range and accurate measurement of deep trench microstructures by a specialized scanning tunneling microscopeBing-Feng Ju, Yuan-Liu Chen, Wei Zhang, et al.
The Review of Scientific Instruments|July 10, 2021
All-optical laser-ultrasonic technology for width and depth gauging of rectangular surface-breaking defectsCheng Chen, Bing-Feng Ju, Xiaoyu Yang, et al.
Sensors (Basel, Switzerland)|November 25, 2023
Novel Information-Driven Smoothing Spline Linearization Method for High-Precision Displacement Sensors Based on Information CriterionsWen-Hao Zhang, Lin Dai, Wang Chen, et al.
The Review of Scientific Instruments|July 3, 2017
Full area covered 3D profile measurement of special-shaped optics based on a new prototype non-contact profilerHui-Lin Du, Zhao-Zhong Zhou, Ze-Qing Sun, et al.
Communications Engineering|September 12, 2024
Multi-view neural 3D reconstruction of micro- and nanostructures with atomic force microscopyShuo Chen, Mao Peng, Yijin Li, et al.
Pageof 4

Showing results (21-30 of 36) with videos related to

Sort By:
Pageof 4
The Review of Scientific Instruments|March 19, 2025
A contact probe based on multi-focus spectral confocal method for in-site measurement of form and position errors of complex surface workpiecesBing Yu, Qiang Ru, Anyu Sun, et al.
The Review of Scientific Instruments|April 9, 2020
A new method for detecting surface defects on curved reflective optics using normalized reflectivityHui-Lin Du, Wen-Hao Zhang, Bing-Feng Ju, et al.
Ultrasonics|February 6, 2018
Numerical and experimental analysis of a focused reflected wave in a multi-layered material based on a ray modelXiaoyu Yang, Chengcheng Zhang, Anyu Sun, et al.
Ultrasonics|August 22, 2018
Simultaneous ultrasonic parameter estimation of a multi-layered material by the PSO-based least squares algorithm using the reflection spectrumXiaoyu Yang, Chengcheng Zhang, Chuanyong Wang, et al.
Science Advances|February 28, 2025
Pixel-level metal blackbody microcavities via hierarchical laser writingChong-Kuong Ng, Tianle Chen, Bing-Feng Ju, et al.
The Review of Scientific Instruments|June 7, 2012
Note: long range and accurate measurement of deep trench microstructures by a specialized scanning tunneling microscopeBing-Feng Ju, Yuan-Liu Chen, Wei Zhang, et al.
The Review of Scientific Instruments|July 10, 2021
All-optical laser-ultrasonic technology for width and depth gauging of rectangular surface-breaking defectsCheng Chen, Bing-Feng Ju, Xiaoyu Yang, et al.
Sensors (Basel, Switzerland)|November 25, 2023
Novel Information-Driven Smoothing Spline Linearization Method for High-Precision Displacement Sensors Based on Information CriterionsWen-Hao Zhang, Lin Dai, Wang Chen, et al.
The Review of Scientific Instruments|July 3, 2017
Full area covered 3D profile measurement of special-shaped optics based on a new prototype non-contact profilerHui-Lin Du, Zhao-Zhong Zhou, Ze-Qing Sun, et al.
Communications Engineering|September 12, 2024
Multi-view neural 3D reconstruction of micro- and nanostructures with atomic force microscopyShuo Chen, Mao Peng, Yijin Li, et al.
Pageof 4