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Analytical Chemistry|December 8, 2020
New Orientation: A Downward-pointing Vertical Inductively Coupled Plasma Mass Spectrometer for the Analysis of MicrosamplesThomas Vonderach, Bodo Hattendorf, Detlef GüntherTalanta|May 18, 2026
Towards nanoparticle analysis using N<sub>2</sub> MICAP-MS: Employed gases, carbon enhancement, and alcohol toleranceMonique Kuonen, Bodo Hattendorf, Detlef GüntherJournal of the American Society for Mass Spectrometry|March 7, 2006
Analyte response in laser ablation inductively coupled plasma mass spectrometryZhongke Wang, Bodo Hattendorf, Detlef GüntherAnalytical and Bioanalytical Chemistry|August 23, 2018
Skip the beat: minimizing aliasing error in LA-ICP-MS measurementsBodo Hattendorf, Urs Hartfelder, Detlef GüntherAnalytical Chemistry|March 14, 2025
ICPMS/MS with Benzene VaporBodo Hattendorf, Tiphanie Renevey, Detlef GüntherJournal of Analytical Atomic Spectrometry|May 13, 2024
Quantification capabilities of N<sub>2</sub> MICAP-MS with solution nebulization and aerosol desolvationMonique Kuonen, Bodo Hattendorf, Detlef GüntherMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 11, 2021
Quantification of Nanoparticles in Dispersions Using Transmission Electron MicroscopyRalf Kaegi, Martin Fierz, Bodo HattendorfAnalytical Chemistry|September 18, 2012
Thickness determination of subnanometer layers using laser ablation inductively coupled plasma mass spectrometryBodo Hattendorf, Jorge Pisonero, Detlef Günther, et al.Journal of Analytical Atomic Spectrometry|March 13, 2023
Characterizing a nitrogen microwave inductively coupled atmospheric-pressure plasma ion source for element mass spectrometryMonique Kuonen, Guanghui Niu, Bodo Hattendorf, et al.Journal of Analytical Atomic Spectrometry|August 30, 2021
LA-ICP-MS using a nitrogen plasma sourceChristoph Neff, Pascal Becker, Bodo Hattendorf, et al.Pageof 5