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Bradley K Alpert

Showing results (1-10 of 8) with videos related to

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SIAM Journal on Scientific Computing : a Publication of the Society for Industrial and Applied Mathematics|October 22, 2020
FAST UPDATING MULTIPOLE COULOMBIC POTENTIAL CALCULATIONThomas A HÖft, Bradley K Alpert
Optics Express|May 9, 2023
Noise-resilient deep learning for integrated circuit tomographyZhen Guo, Zhiguang Liu, George Barbastathis, et al.
Optics Express|October 13, 2022
Physics-assisted generative adversarial network for X-ray tomographyZhen Guo, Jung Ki Song, George Barbastathis, et al.
Microsystems & Nanoengineering|April 17, 2023
A tabletop X-ray tomography instrument for nanometer-scale imaging: reconstructionsZachary H Levine, Bradley K Alpert, Amber L Dagel, et al.
Metrologia|April 27, 2026
Primary activity measurement of an Am-241 solution using microgram inkjet gravimetry and decay energy spectrometryRyan P Fitzgerald, Bradley K Alpert, Denis E Bergeron, et al.
Journal of Research of the National Institute of Standards and Technology|March 12, 2024
Toward a New Primary Standardization of Radionuclide Massic Activity Using Microcalorimetry and Quantitative Milligram-Scale SamplesRyan P Fitzgerald, Bradley K Alpert, Daniel T Becker, et al.
The Journal of Physical Chemistry Letters|February 18, 2017
Ultrafast Time-Resolved X-ray Absorption Spectroscopy of Ferrioxalate Photolysis with a Laser Plasma X-ray Source and Microcalorimeter ArrayGalen C O'Neil, Luis Miaja-Avila, Young Il Joe, et al.
Sensors (Basel, Switzerland)|May 11, 2024
Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor SpectrometerNathan Nakamura, Paul Szypryt, Amber L Dagel, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
SIAM Journal on Scientific Computing : a Publication of the Society for Industrial and Applied Mathematics|October 22, 2020
FAST UPDATING MULTIPOLE COULOMBIC POTENTIAL CALCULATIONThomas A HÖft, Bradley K Alpert
Optics Express|May 9, 2023
Noise-resilient deep learning for integrated circuit tomographyZhen Guo, Zhiguang Liu, George Barbastathis, et al.
Optics Express|October 13, 2022
Physics-assisted generative adversarial network for X-ray tomographyZhen Guo, Jung Ki Song, George Barbastathis, et al.
Microsystems & Nanoengineering|April 17, 2023
A tabletop X-ray tomography instrument for nanometer-scale imaging: reconstructionsZachary H Levine, Bradley K Alpert, Amber L Dagel, et al.
Metrologia|April 27, 2026
Primary activity measurement of an Am-241 solution using microgram inkjet gravimetry and decay energy spectrometryRyan P Fitzgerald, Bradley K Alpert, Denis E Bergeron, et al.
Journal of Research of the National Institute of Standards and Technology|March 12, 2024
Toward a New Primary Standardization of Radionuclide Massic Activity Using Microcalorimetry and Quantitative Milligram-Scale SamplesRyan P Fitzgerald, Bradley K Alpert, Daniel T Becker, et al.
The Journal of Physical Chemistry Letters|February 18, 2017
Ultrafast Time-Resolved X-ray Absorption Spectroscopy of Ferrioxalate Photolysis with a Laser Plasma X-ray Source and Microcalorimeter ArrayGalen C O'Neil, Luis Miaja-Avila, Young Il Joe, et al.
Sensors (Basel, Switzerland)|May 11, 2024
Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor SpectrometerNathan Nakamura, Paul Szypryt, Amber L Dagel, et al.
Pageof 1