Electron Microscope Tomography and Single-particle Reconstruction
Computed Tomography
Imaging Studies I: CT and MRI
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Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
Published on: May 27, 2008
Zachary H Levine1, Bradley K Alpert2, Amber L Dagel3
1National Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
Researchers created 3D reconstructions of integrated circuits using advanced X-ray computed tomography. This innovative method allows detailed imaging without sample destruction, confirming circuit design accuracy.
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