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Brian P Gorman

Showing results (1-10 of 25) with videos related to

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Ultramicroscopy|September 5, 2018
Self-consistent atom probe tomography reconstructions utilizing electron microscopyDavid R Diercks, Brian P Gorman
The Review of Scientific Instruments|June 6, 2018
Electron diffraction and imaging for atom probe tomographyRita Kirchhofer, David R Diercks, Brian P Gorman
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2007
Atom probe analysis of III-V and Si-based semiconductor photovoltaic structuresBrian P Gorman, Andrew G Norman, Yanfa Yan
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 18, 2016
Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping LayersDavid R Diercks, Brian P Gorman, Johannes J L Mulders
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 20, 2021
Integrative Atom Probe Tomography Using Scanning Transmission Electron Microscopy-Centric Atom Placement as a Step Toward Atomic-Scale TomographyAnna V Ceguerra, Andrew J Breen, Julie M Cairney, et al.
Ultramicroscopy|November 26, 2019
Orientation mapping with Kikuchi patterns generated from a focused STEM probe and indexing with commercially available EDAX softwareGeorge L Burton, Stuart Wright, Adam Stokes, et al.
Nano Letters|September 18, 2020
Synthesis of Tunable SnS-TaS<sub>2</sub> Nanoscale SuperlatticesDennice M Roberts, Dylan Bardgett, Brian P Gorman, et al.
Ultramicroscopy|March 18, 2018
Correlative Raman spectroscopy and focused ion beam for targeted phase boundary analysis of titania polymorphsJohn S Mangum, Lisa H Chan, Ute Schmidt, et al.
Nano Letters|August 31, 2016
Effect of Diels-Alder Reaction in C<sub>60</sub>-Tetracene Photovoltaic DevicesAndrew P Proudian, Matthew B Jaskot, Christelle Lyiza, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 18, 2022
Atom Probe Tomography Using a Wavelength-Tunable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light SourceAnn N Chiaramonti, Luis Miaja-Avila, Paul T Blanchard, et al.
Pageof 3

Showing results (1-10 of 25) with videos related to

Sort By:
Pageof 3
Ultramicroscopy|September 5, 2018
Self-consistent atom probe tomography reconstructions utilizing electron microscopyDavid R Diercks, Brian P Gorman
The Review of Scientific Instruments|June 6, 2018
Electron diffraction and imaging for atom probe tomographyRita Kirchhofer, David R Diercks, Brian P Gorman
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2007
Atom probe analysis of III-V and Si-based semiconductor photovoltaic structuresBrian P Gorman, Andrew G Norman, Yanfa Yan
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 18, 2016
Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping LayersDavid R Diercks, Brian P Gorman, Johannes J L Mulders
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 20, 2021
Integrative Atom Probe Tomography Using Scanning Transmission Electron Microscopy-Centric Atom Placement as a Step Toward Atomic-Scale TomographyAnna V Ceguerra, Andrew J Breen, Julie M Cairney, et al.
Ultramicroscopy|November 26, 2019
Orientation mapping with Kikuchi patterns generated from a focused STEM probe and indexing with commercially available EDAX softwareGeorge L Burton, Stuart Wright, Adam Stokes, et al.
Nano Letters|September 18, 2020
Synthesis of Tunable SnS-TaS<sub>2</sub> Nanoscale SuperlatticesDennice M Roberts, Dylan Bardgett, Brian P Gorman, et al.
Ultramicroscopy|March 18, 2018
Correlative Raman spectroscopy and focused ion beam for targeted phase boundary analysis of titania polymorphsJohn S Mangum, Lisa H Chan, Ute Schmidt, et al.
Nano Letters|August 31, 2016
Effect of Diels-Alder Reaction in C<sub>60</sub>-Tetracene Photovoltaic DevicesAndrew P Proudian, Matthew B Jaskot, Christelle Lyiza, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 18, 2022
Atom Probe Tomography Using a Wavelength-Tunable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light SourceAnn N Chiaramonti, Luis Miaja-Avila, Paul T Blanchard, et al.
Pageof 3