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Journal of Research of the National Institute of Standards and Technology
|
January 1, 1997
Guidelines for Expressing the Uncertainty of Measurement Results Containing Uncorrected Bias
Steven D Phillips, Keith R Eberhardt, Brian Parry
Journal of Research of the National Institute of Standards and Technology
|
February 23, 2016
A Model for Geometry-Dependent Errors in Length Artifacts
Daniel Sawyer, Brian Parry, Steven Phillips, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Journal of Research of the National Institute of Standards and Technology
|
January 1, 1997
Guidelines for Expressing the Uncertainty of Measurement Results Containing Uncorrected Bias
Steven D Phillips, Keith R Eberhardt, Brian Parry
Journal of Research of the National Institute of Standards and Technology
|
February 23, 2016
A Model for Geometry-Dependent Errors in Length Artifacts
Daniel Sawyer, Brian Parry, Steven Phillips, et al.
Page
of 1