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Burkhard Beckhoff

Showing results (1-10 of 41) with videos related to

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Nanomaterials (Basel, Switzerland)|July 9, 2022
Traceable Characterization of Nanomaterials by X-ray Spectrometry Using Calibrated InstrumentationBurkhard Beckhoff
Analytical Chemistry|July 9, 2015
Nondestructive Speciation Depth Profiling of Complex TiOx Nanolayer Structures by Grazing Incidence X-ray Fluorescence Analysis and Near Edge X-ray Absorption Fine Structure SpectroscopyBeatrix Pollakowski, Burkhard Beckhoff
Analytica Chimica Acta|January 21, 2022
Reliable compositional analysis of airborne particulate matter beyond the quantification limits of total reflection X-ray fluorescenceYves Kayser, János Osán, Philipp Hönicke, et al.
Analytical Chemistry|October 4, 2011
Complementary characterization of buried nanolayers by quantitative X-ray fluorescence spectrometry under conventional and grazing incidence conditionsRainer Unterumsberger, Beatrix Pollakowski, Matthias Müller, et al.
X-Ray Spectrometry : XRS|May 17, 2019
Valence-to-core XES of Ti, TiO and TiO<sub>2</sub> by means of a double full-cylinder crystal von Hamos spectrometerMalte Wansleben, John Vinson, Ina Holfelder, et al.
Physical Review. B|October 18, 2016
Quasiparticle Lifetime Broadening in Resonant X-ray Scattering of NH<sub>4</sub>NO<sub>3</sub>John Vinson, Terrence Jach, Matthias Müller, et al.
Physical Review. B|January 16, 2018
Resonant X-ray Emission of Hexagonal Boron NitrideJohn Vinson, Terrence Jach, Matthias Müller, et al.
Physical Chemistry Chemical Physics : PCCP|March 14, 2015
Qualifying label components for effective biosensing using advanced high-throughput SEIRA methodologyAndrea Hornemann, Diane Eichert, Sabine Flemig, et al.
Physical Review. B|March 14, 2020
Resonant X-ray Emission and Valence-band Lifetime Broadening in LiNO<sub>3</sub>John Vinson, Terrence Jach, Matthias Müller, et al.
Analytical Chemistry|September 21, 2007
Reference-free total reflection X-ray fluorescence analysis of semiconductor surfaces with synchrotron radiationBurkhard Beckhoff, Rolf Fliegauf, Michael Kolbe, et al.
Pageof 5

Showing results (1-10 of 41) with videos related to

Sort By:
Pageof 5
Nanomaterials (Basel, Switzerland)|July 9, 2022
Traceable Characterization of Nanomaterials by X-ray Spectrometry Using Calibrated InstrumentationBurkhard Beckhoff
Analytical Chemistry|July 9, 2015
Nondestructive Speciation Depth Profiling of Complex TiOx Nanolayer Structures by Grazing Incidence X-ray Fluorescence Analysis and Near Edge X-ray Absorption Fine Structure SpectroscopyBeatrix Pollakowski, Burkhard Beckhoff
Analytica Chimica Acta|January 21, 2022
Reliable compositional analysis of airborne particulate matter beyond the quantification limits of total reflection X-ray fluorescenceYves Kayser, János Osán, Philipp Hönicke, et al.
Analytical Chemistry|October 4, 2011
Complementary characterization of buried nanolayers by quantitative X-ray fluorescence spectrometry under conventional and grazing incidence conditionsRainer Unterumsberger, Beatrix Pollakowski, Matthias Müller, et al.
X-Ray Spectrometry : XRS|May 17, 2019
Valence-to-core XES of Ti, TiO and TiO<sub>2</sub> by means of a double full-cylinder crystal von Hamos spectrometerMalte Wansleben, John Vinson, Ina Holfelder, et al.
Physical Review. B|October 18, 2016
Quasiparticle Lifetime Broadening in Resonant X-ray Scattering of NH<sub>4</sub>NO<sub>3</sub>John Vinson, Terrence Jach, Matthias Müller, et al.
Physical Review. B|January 16, 2018
Resonant X-ray Emission of Hexagonal Boron NitrideJohn Vinson, Terrence Jach, Matthias Müller, et al.
Physical Chemistry Chemical Physics : PCCP|March 14, 2015
Qualifying label components for effective biosensing using advanced high-throughput SEIRA methodologyAndrea Hornemann, Diane Eichert, Sabine Flemig, et al.
Physical Review. B|March 14, 2020
Resonant X-ray Emission and Valence-band Lifetime Broadening in LiNO<sub>3</sub>John Vinson, Terrence Jach, Matthias Müller, et al.
Analytical Chemistry|September 21, 2007
Reference-free total reflection X-ray fluorescence analysis of semiconductor surfaces with synchrotron radiationBurkhard Beckhoff, Rolf Fliegauf, Michael Kolbe, et al.
Pageof 5