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Applied Optics|September 22, 2010
Multiwavelength (0.45-10.6 µm) angle-resolved scatterometer or how to extend the optical windowC Amra, D Torricini, P RocheApplied Optics|June 18, 2010
Description of a scattering apparatus: application to the problems of characterization of opaque surfacesC Amra, C Grezes-Besset, P Roche, et al.Applied Optics|September 22, 2010
From light scattering to the microstructure of thin-film multilayersC AmraApplied Optics|August 1, 1997
Scattering-reduction effect with overcoated rough surfaces: theory and experimentH Giovannini, C AmraApplied Optics|February 13, 2008
Dielectric thin films for maximized absorption with standard quality black surfacesH Giovannini, C AmraOptics Express|September 15, 2015
Speckle intensity statistics for chromatic scattering media under partially polarized illuminationG Soriano, M Zerrad, C AmraOptics Express|October 10, 2013
Mapping the coherence time of far-field speckle scattered by disordered mediaG Soriano, M Zerrad, C AmraOptics Letters|September 14, 2019
Anti-scattering effect analyzed with an exact theory of light scattering from rough multilayersG Soriano, M Zerrad, C AmraOptics Express|June 2, 2009
Optical properties calculated for multidielectric quarter-wave coatings on microspheresPhilippe Voarino, C Deumié, C AmraPageof 35