C Emil Tripa - JoVE Visualize

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Journal of Visualized Experiments : Jove|March 15, 2013

Characterization of surface modifications by white light interferometry: applications in ion sputtering, laser ablation, and tribology experimentsSergey V Baryshev, Robert A Erck, Jerry F Moore, et al.

Rapid Communications in Mass Spectrometry : RCM|September 8, 2012

High-resolution secondary ion mass spectrometry depth profiling of nanolayersSergey V Baryshev, Alexander V Zinovev, C Emil Tripa, et al.

Science (New York, N.Y.)|January 31, 2004

Extinct technetium in silicon carbide stardust grains: implications for stellar nucleosynthesisMichael R Savina, Andrew M Davis, C Emil Tripa, et al.

European Journal of Mass Spectrometry (Chichester, England)|June 10, 2010

Ion microscopy with resonant ionization mass spectrometry: time-of-flight depth profiling with improved isotopic precisionMichael J Pellin, Igor V Veryovkin, Jonathan Levine, et al.

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Showing results (1-10 of 4) with videos related to

Sort By:

Pageof 1

Journal of Visualized Experiments : Jove|March 15, 2013

Characterization of surface modifications by white light interferometry: applications in ion sputtering, laser ablation, and tribology experimentsSergey V Baryshev, Robert A Erck, Jerry F Moore, et al.

Rapid Communications in Mass Spectrometry : RCM|September 8, 2012

High-resolution secondary ion mass spectrometry depth profiling of nanolayersSergey V Baryshev, Alexander V Zinovev, C Emil Tripa, et al.

Science (New York, N.Y.)|January 31, 2004

Extinct technetium in silicon carbide stardust grains: implications for stellar nucleosynthesisMichael R Savina, Andrew M Davis, C Emil Tripa, et al.

European Journal of Mass Spectrometry (Chichester, England)|June 10, 2010

Ion microscopy with resonant ionization mass spectrometry: time-of-flight depth profiling with improved isotopic precisionMichael J Pellin, Igor V Veryovkin, Jonathan Levine, et al.

Pageof 1