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Applied Optics|March 4, 2010
Fast computation method for derivatives of multilayer stack reflectanceC J Laan, H J FrankenaApplied Optics|June 18, 2010
Integrated optical interferometer with a stacked waveguide structureS Wu, H J FrankenaApplied Optics|February 21, 2008
Testing aspheric surfaces: simple method with a circular stopA Handojo, H J FrankenaApplied Optics|October 12, 2010
Real-time displacement measurement using a multicamera phase-stepping speckle interferometerA J Haasteren, H J FrankenaApplied Optics|October 22, 2010
Equivalent layers: another way to look at themC J van der Laan, H J FrankenaApplied Optics|February 28, 2008
Fluid jet polishing of optical surfacesO W Fähnle, H Brug, H J FrankenaApplied Optics|June 12, 2010
Thickness measurement using Young's interferometric experimentC J van der Laan, H J FrankenaApplied Optics|August 14, 2010
Adaptation of the refractive indices of antireflection coatings to other surrounding mediaC J van der Laan, H J FrankenaApplied Optics|August 12, 2010
Linear approximation for measurement errors in phase shifting interferometryJ van Wingerden, H J Frankena, C SmorenburgPageof 2