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Measurements of Strain01:27

Measurements of Strain

Strain quantifies the deformation of a material under force, typically measured as normal strain, which represents the change in length when compared with the original length. Electrical strain gauges are used for enhanced accuracy. These devices consist of a conductive wire mounted on a paper backing that adheres to the material's surface. These gauges operate on the piezoresistive effect, where the wire's electrical resistance changes in response to mechanical deformation. The strain gauge...
Uncertainty in Measurement: Reading Instruments02:46

Uncertainty in Measurement: Reading Instruments

Counting is the type of measurement that is free from uncertainty, provided the number of objects being counted does not change during the process. Such measurements result in exact numbers. By counting the eggs in a carton, for instance, one can determine exactly how many eggs are there in the carton. Similarly, the numbers of defined quantities are also exact. For example, 1 foot is exactly 12 inches, 1 inch is exactly 2.54 centimeters, and 1 gram is exactly 0.001 kilograms. Quantities...
Indeterminate Structure01:18

Indeterminate Structure

Indeterminate structures refer to structures where internal forces and reactions cannot be determined using only the equations of static equilibrium.  Indeterminate structures have more unknown forces and reaction forces than equations of static equilibrium that can be used to determine them. Indeterminate structures are often used in engineering to create complex, efficient, and aesthetically pleasing structures. There are various types of indeterminate structures used in engineering and some...

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Related Experiment Video

Updated: Jun 12, 2026

AFM-based Mapping of the Elastic Properties of Cell Walls: at Tissue, Cellular, and Subcellular Resolutions
10:26

AFM-based Mapping of the Elastic Properties of Cell Walls: at Tissue, Cellular, and Subcellular Resolutions

Published on: July 24, 2014

Thickness measurement using Young's interferometric experiment.

C J van der Laan, H J Frankena

    Applied Optics
    |June 12, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces a novel interferometer for precise optical thin film thickness measurement. The method achieves high accuracy, with a standard deviation around 0.3 nm, without needing calibration layers.

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    AFM-based Mapping of the Elastic Properties of Cell Walls: at Tissue, Cellular, and Subcellular Resolutions
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    Published on: July 24, 2014

    Quantitative Hardness Measurement by Instrumented AFM-indentation
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    Published on: November 22, 2016

    Area of Science:

    • Optics
    • Materials Science
    • Metrology

    Background:

    • Accurate measurement of optical thin film thickness is crucial for device performance.
    • Existing calibration methods can be complex and time-consuming.

    Purpose of the Study:

    • To present a new interferometer design for optical thin film thickness determination.
    • To demonstrate a calibration-free measurement approach.

    Main Methods:

    • Utilized an interferometer for thickness measurements.
    • Employed a wavelength-based unit of length for calculations.
    • Performed repeated measurements to assess precision.

    Main Results:

    • Achieved a standard deviation of approximately 0.3 nm in thickness measurements.
    • Demonstrated thickness determination as a fraction of the applied wavelength.
    • Validated a method that eliminates the need for calibration layers.

    Conclusions:

    • The developed interferometer offers a precise and efficient method for optical thin film thickness measurement.
    • The calibration-free nature simplifies the measurement process.
    • The high precision (0.3 nm std. dev.) makes it suitable for demanding applications.