Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Equivalent layers: another way to look at them.

Applied optics·2010
Same author

Adaptation of the refractive indices of antireflection coatings to other surrounding media.

Applied optics·2010
Same author

Linear approximation for measurement errors in phase shifting interferometry.

Applied optics·2010
Same author

Thickness matching in planar multilayer waveguides.

Applied optics·2010
Same author

Integrated optical interferometer with a stacked waveguide structure.

Applied optics·2010
Same author

Thickness measurement using Young's interferometric experiment.

Applied optics·2010
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles

Related Experiment Video

Updated: Jun 8, 2026

Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform
06:25

Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform

Published on: February 12, 2014

Real-time displacement measurement using a multicamera phase-stepping speckle interferometer.

A J Haasteren, H J Frankena

    Applied Optics
    |October 12, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A new interferometer system simultaneously records and calculates surface displacements, overcoming disturbances common in standard phase-stepping speckle interferometry. This advanced method achieves high accuracy, exceeding λ/55, for precise surface displacement measurements.

    More Related Videos

    Implementation of a Reference Interferometer for Nanodetection
    16:11

    Implementation of a Reference Interferometer for Nanodetection

    Published on: April 26, 2014

    Live Cell Imaging of F-actin Dynamics via Fluorescent Speckle Microscopy (FSM)
    19:16

    Live Cell Imaging of F-actin Dynamics via Fluorescent Speckle Microscopy (FSM)

    Published on: August 5, 2009

    Related Experiment Videos

    Last Updated: Jun 8, 2026

    Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform
    06:25

    Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform

    Published on: February 12, 2014

    Implementation of a Reference Interferometer for Nanodetection
    16:11

    Implementation of a Reference Interferometer for Nanodetection

    Published on: April 26, 2014

    Live Cell Imaging of F-actin Dynamics via Fluorescent Speckle Microscopy (FSM)
    19:16

    Live Cell Imaging of F-actin Dynamics via Fluorescent Speckle Microscopy (FSM)

    Published on: August 5, 2009

    Area of Science:

    • Optical metrology
    • Experimental mechanics

    Background:

    • Standard phase-stepping speckle interferometry is susceptible to environmental disturbances during interferogram recording.
    • Accurate measurement of surface point displacements is crucial in various engineering applications.

    Purpose of the Study:

    • To develop and evaluate a novel interferometer system capable of simultaneous recording and displacement calculation.
    • To mitigate data vulnerability to disturbances in interferometric measurements.

    Main Methods:

    • Development of an interferometer integrated with a computational system for simultaneous acquisition of three phase-stepped interferograms.
    • Evaluation of the system through measurements of out-of-plane rotation on a flat surface.

    Main Results:

    • The developed system calculates surface displacements at a rate of 25 times per second.
    • Noise reduction via filtering decreases the calculation speed to 12.5 displacements per second.
    • The system achieves measurement accuracy exceeding λ/55 with applied filtering.

    Conclusions:

    • The novel interferometer system effectively overcomes disturbances in displacement measurements.
    • Simultaneous recording and computation enable rapid and accurate surface displacement analysis.
    • The system demonstrates high precision for out-of-plane rotation measurements.