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Related Concept Videos

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Measurements of Strain

Strain quantifies the deformation of a material under force, typically measured as normal strain, which represents the change in length when compared with the original length. Electrical strain gauges are used for enhanced accuracy. These devices consist of a conductive wire mounted on a paper backing that adheres to the material's surface. These gauges operate on the piezoresistive effect, where the wire's electrical resistance changes in response to mechanical deformation. The strain gauge...
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Updated: Jun 12, 2026

AFM-based Mapping of the Elastic Properties of Cell Walls: at Tissue, Cellular, and Subcellular Resolutions
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Thickness measurement using Young's interferometric experiment.

C J van der Laan, H J Frankena

    Applied Optics
    |June 12, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces a novel interferometer for precise optical thin film thickness measurement. The method achieves high accuracy, with a standard deviation around 0.3 nm, without needing calibration layers.

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    Area of Science:

    • Optics
    • Materials Science
    • Metrology

    Background:

    • Accurate measurement of optical thin film thickness is crucial for device performance.
    • Existing calibration methods can be complex and time-consuming.

    Purpose of the Study:

    • To present a new interferometer design for optical thin film thickness determination.
    • To demonstrate a calibration-free measurement approach.

    Main Methods:

    • Utilized an interferometer for thickness measurements.
    • Employed a wavelength-based unit of length for calculations.
    • Performed repeated measurements to assess precision.

    Main Results:

    • Achieved a standard deviation of approximately 0.3 nm in thickness measurements.
    • Demonstrated thickness determination as a fraction of the applied wavelength.
    • Validated a method that eliminates the need for calibration layers.

    Conclusions:

    • The developed interferometer offers a precise and efficient method for optical thin film thickness measurement.
    • The calibration-free nature simplifies the measurement process.
    • The high precision (0.3 nm std. dev.) makes it suitable for demanding applications.