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C T Putkunz

Showing results (1-10 of 7) with videos related to

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Ultramicroscopy|September 21, 2011
Direct exit-wave reconstruction from a single defocused imageA J Morgan, A V Martin, A J D'Alfonso, et al.
Nature Communications|July 18, 2014
Detailed observation of space-charge dynamics using ultracold ion bunchesD Murphy, R W Speirs, D V Sheludko, et al.
Optics Express|July 1, 2010
Fresnel coherent diffraction tomographyC T Putkunz, M A Pfeifer, A G Peele, et al.
Optics Express|February 23, 2010
Use of a complex constraint in coherent diffractive imagingJ N Clark, C T Putkunz, M A Pfeifer, et al.
Optics Express|February 12, 2014
Using coherent X-ray ptychography to probe medium-range orderA T J Torrance, B Abbey, C T Putkunz, et al.
Optics Express|November 29, 2012
Nanoscale Fresnel coherent diffraction imaging tomography using ptychographyI Peterson, B Abbey, C T Putkunz, et al.
The Review of Scientific Instruments|April 3, 2012
An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV rangeD J Vine, G J Williams, J N Clark, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|September 21, 2011
Direct exit-wave reconstruction from a single defocused imageA J Morgan, A V Martin, A J D'Alfonso, et al.
Nature Communications|July 18, 2014
Detailed observation of space-charge dynamics using ultracold ion bunchesD Murphy, R W Speirs, D V Sheludko, et al.
Optics Express|July 1, 2010
Fresnel coherent diffraction tomographyC T Putkunz, M A Pfeifer, A G Peele, et al.
Optics Express|February 23, 2010
Use of a complex constraint in coherent diffractive imagingJ N Clark, C T Putkunz, M A Pfeifer, et al.
Optics Express|February 12, 2014
Using coherent X-ray ptychography to probe medium-range orderA T J Torrance, B Abbey, C T Putkunz, et al.
Optics Express|November 29, 2012
Nanoscale Fresnel coherent diffraction imaging tomography using ptychographyI Peterson, B Abbey, C T Putkunz, et al.
The Review of Scientific Instruments|April 3, 2012
An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV rangeD J Vine, G J Williams, J N Clark, et al.
Pageof 1