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Ultramicroscopy
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September 21, 2011
Direct exit-wave reconstruction from a single defocused image
A J Morgan, A V Martin, A J D'Alfonso, et al.
Nature Communications
|
July 18, 2014
Detailed observation of space-charge dynamics using ultracold ion bunches
D Murphy, R W Speirs, D V Sheludko, et al.
Optics Express
|
July 1, 2010
Fresnel coherent diffraction tomography
C T Putkunz, M A Pfeifer, A G Peele, et al.
Optics Express
|
February 23, 2010
Use of a complex constraint in coherent diffractive imaging
J N Clark, C T Putkunz, M A Pfeifer, et al.
Optics Express
|
February 12, 2014
Using coherent X-ray ptychography to probe medium-range order
A T J Torrance, B Abbey, C T Putkunz, et al.
Optics Express
|
November 29, 2012
Nanoscale Fresnel coherent diffraction imaging tomography using ptychography
I Peterson, B Abbey, C T Putkunz, et al.
The Review of Scientific Instruments
|
April 3, 2012
An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV range
D J Vine, G J Williams, J N Clark, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 7) with videos related to
Sort By:
Page
of 1
Ultramicroscopy
|
September 21, 2011
Direct exit-wave reconstruction from a single defocused image
A J Morgan, A V Martin, A J D'Alfonso, et al.
Nature Communications
|
July 18, 2014
Detailed observation of space-charge dynamics using ultracold ion bunches
D Murphy, R W Speirs, D V Sheludko, et al.
Optics Express
|
July 1, 2010
Fresnel coherent diffraction tomography
C T Putkunz, M A Pfeifer, A G Peele, et al.
Optics Express
|
February 23, 2010
Use of a complex constraint in coherent diffractive imaging
J N Clark, C T Putkunz, M A Pfeifer, et al.
Optics Express
|
February 12, 2014
Using coherent X-ray ptychography to probe medium-range order
A T J Torrance, B Abbey, C T Putkunz, et al.
Optics Express
|
November 29, 2012
Nanoscale Fresnel coherent diffraction imaging tomography using ptychography
I Peterson, B Abbey, C T Putkunz, et al.
The Review of Scientific Instruments
|
April 3, 2012
An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV range
D J Vine, G J Williams, J N Clark, et al.
Page
of 1