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C Tarrio

Showing results (1-10 of 9) with videos related to

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Applied Optics|September 22, 2010
Influence of electrical isolation on the structure and reflectivity of multilayer coatings deposited on dielectric substratesG Gutman, J Keem, J Wood, et al.
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|August 27, 2021
EUV-induced carbon growth at contaminant pressures between 10<sup>-10</sup> mbar and 10<sup>-6</sup> mbar: Experiment and modelS B Hill, C Tarrio, R F Berg, et al.
Applied Optics|October 2, 2010
Soft-x-ray damage to p-terphenyl coatings for detectorsE L Benitez, M L Dark, D E Husk, et al.
Applied Optics|February 21, 2008
Optical constants of in situ-deposited films of important extreme-ultraviolet multilayer mirror materialsC Tarrio, R N Watts, T B Lucatorto, et al.
The Review of Scientific Instruments|December 3, 2015
Note: Thermally stable thin-film filters for high-power extreme-ultraviolet applicationsC Tarrio, R F Berg, T B Lucatorto, et al.
Journal of X-Ray Science and Technology|February 11, 2011
The New NIST/ARPA National Soft X-Ray Reflectometry FacilityC Tarrio, R N Watts, T B Lucatorto, et al.
Optics Letters|October 27, 2009
Si/B(4)C narrow-bandpass mirrors for the extreme ultravioletJ M Slaughter, B S Medower, R N Watts, et al.
The Review of Scientific Instruments|August 3, 2011
A synchrotron beamline for extreme-ultraviolet photoresist testingC Tarrio, S Grantham, S B Hill, et al.
Applied Optics|August 23, 2007
High-efficiency fast scintillators for "optical" soft x-ray arrays for laboratory plasma diagnosticsL F Delgado-Aparicio, D Stutman, K Tritz, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Applied Optics|September 22, 2010
Influence of electrical isolation on the structure and reflectivity of multilayer coatings deposited on dielectric substratesG Gutman, J Keem, J Wood, et al.
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|August 27, 2021
EUV-induced carbon growth at contaminant pressures between 10<sup>-10</sup> mbar and 10<sup>-6</sup> mbar: Experiment and modelS B Hill, C Tarrio, R F Berg, et al.
Applied Optics|October 2, 2010
Soft-x-ray damage to p-terphenyl coatings for detectorsE L Benitez, M L Dark, D E Husk, et al.
Applied Optics|February 21, 2008
Optical constants of in situ-deposited films of important extreme-ultraviolet multilayer mirror materialsC Tarrio, R N Watts, T B Lucatorto, et al.
The Review of Scientific Instruments|December 3, 2015
Note: Thermally stable thin-film filters for high-power extreme-ultraviolet applicationsC Tarrio, R F Berg, T B Lucatorto, et al.
Journal of X-Ray Science and Technology|February 11, 2011
The New NIST/ARPA National Soft X-Ray Reflectometry FacilityC Tarrio, R N Watts, T B Lucatorto, et al.
Optics Letters|October 27, 2009
Si/B(4)C narrow-bandpass mirrors for the extreme ultravioletJ M Slaughter, B S Medower, R N Watts, et al.
The Review of Scientific Instruments|August 3, 2011
A synchrotron beamline for extreme-ultraviolet photoresist testingC Tarrio, S Grantham, S B Hill, et al.
Applied Optics|August 23, 2007
High-efficiency fast scintillators for "optical" soft x-ray arrays for laboratory plasma diagnosticsL F Delgado-Aparicio, D Stutman, K Tritz, et al.
Pageof 1