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C Trager-Cowan

Showing results (1-10 of 9) with videos related to

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Ultramicroscopy|October 10, 2017
Practical application of direct electron detectors to EBSD mapping in 2D and 3DK P Mingard, M Stewart, M G Gee, et al.
Journal of Microscopy|January 31, 2020
Improving EBSD precision by orientation refinement with full pattern matchingA Winkelmann, B M Jablon, V S Tong, et al.
Ultramicroscopy|May 4, 2020
Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscopeG Naresh-Kumar, A Alasmari, G Kusch, et al.
Journal of Microscopy|May 6, 2017
Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applicationsA Winkelmann, G Nolze, S Vespucci, et al.
Nano Letters|May 1, 2019
Determining GaN Nanowire Polarity and its Influence on Light Emission in the Scanning Electron MicroscopeG Naresh-Kumar, J Bruckbauer, A Winkelmann, et al.
Scientific Reports|September 9, 2017
Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffractionG Naresh-Kumar, A Vilalta-Clemente, H Jussila, et al.
Physical Review Letters|May 1, 2012
Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscopeG Naresh-Kumar, B Hourahine, P R Edwards, et al.
Scientific Reports|July 30, 2020
Influence of an InGaN superlattice pre-layer on the performance of semi-polar (11-22) green LEDs grown on siliconX Zhao, K Huang, J Bruckbauer, et al.
Journal of Microscopy|May 9, 2002
Characterization of nitride thin films by electron backscatter diffractionC Trager-Cowan, F Sweeney, J Hastie, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|October 10, 2017
Practical application of direct electron detectors to EBSD mapping in 2D and 3DK P Mingard, M Stewart, M G Gee, et al.
Journal of Microscopy|January 31, 2020
Improving EBSD precision by orientation refinement with full pattern matchingA Winkelmann, B M Jablon, V S Tong, et al.
Ultramicroscopy|May 4, 2020
Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscopeG Naresh-Kumar, A Alasmari, G Kusch, et al.
Journal of Microscopy|May 6, 2017
Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applicationsA Winkelmann, G Nolze, S Vespucci, et al.
Nano Letters|May 1, 2019
Determining GaN Nanowire Polarity and its Influence on Light Emission in the Scanning Electron MicroscopeG Naresh-Kumar, J Bruckbauer, A Winkelmann, et al.
Scientific Reports|September 9, 2017
Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffractionG Naresh-Kumar, A Vilalta-Clemente, H Jussila, et al.
Physical Review Letters|May 1, 2012
Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscopeG Naresh-Kumar, B Hourahine, P R Edwards, et al.
Scientific Reports|July 30, 2020
Influence of an InGaN superlattice pre-layer on the performance of semi-polar (11-22) green LEDs grown on siliconX Zhao, K Huang, J Bruckbauer, et al.
Journal of Microscopy|May 9, 2002
Characterization of nitride thin films by electron backscatter diffractionC Trager-Cowan, F Sweeney, J Hastie, et al.
Pageof 1