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Micromachines|April 27, 2024
A Method for Automatically Predicting the Radiation-Induced Vulnerability of Unit Integrated CircuitsRui Dong, Hongliang Lu, Caozhen Yang, et al.
Micromachines|July 27, 2024
Efficient Modeling of Single Event Transient Effect with Limited Peak Current: Implications for Logic CircuitsYujian Wang, Hongliang Lu, Caozhen Yang, et al.
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