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Carlos Wessels

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Applied Spectroscopy|July 1, 2017
Fast High-Resolution Screening Method for Reactive Surfaces by Combining Atomic Force Microscopy and Surface-Enhanced Raman ScatteringCamiel H van Hoorn, Carlos Wessels, Freek Ariese, et al.
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Applied Spectroscopy|July 1, 2017
Fast High-Resolution Screening Method for Reactive Surfaces by Combining Atomic Force Microscopy and Surface-Enhanced Raman ScatteringCamiel H van Hoorn, Carlos Wessels, Freek Ariese, et al.
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