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Ultramicroscopy|September 14, 2024
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materialsCarter Francis, Paul M Voyles
Ultramicroscopy|October 21, 2021
Correlation symmetry analysis of electron nanodiffraction from amorphous materialsShuoyuan Huang, Carter Francis, Jittisa Ketkaew, et al.
Ultramicroscopy|September 16, 2022
Large Area, High Resolution Mapping of Approximate Rotational Symmetries in a Pd<sub>77.5</sub>Cu<sub>6</sub>Si<sub>16.5</sub> Metallic Glass Thin FilmShuoyuan Huang, Carter Francis, John Sunderland, et al.
Ultramicroscopy|November 24, 2023
Momentum transfer resolved electron correlation microscopyShuoyuan Huang, Paul M Voyles
Journal of Electron Microscopy|July 9, 2010
Flexible formation of coherent probes on an aberration-corrected STEM with three condensersFeng Yi, Peter Tiemeijer, Paul M Voyles
Ultramicroscopy|January 25, 2020
Atomic resolution convergent beam electron diffraction analysis using convolutional neural networksChenyu Zhang, Jie Feng, Luis Rangel DaCosta, et al.
Ultramicroscopy|October 8, 2020
Denoising atomic resolution 4D scanning transmission electron microscopy data with tensor singular value decompositionChenyu Zhang, Rungang Han, Anru R Zhang, et al.
Inorganic Chemistry|October 19, 2018
Paths to Stabilizing Electronically Aberrant Compounds: A Defect-Stabilized Polymorph and Constrained Atomic Motion in PtGa<sub>2</sub>Hillary E Mitchell Warden, Paul M Voyles, Daniel C Fredrickson
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Benchmark Tests of Atom Segmentation Deep Learning Models with a Consistent DatasetJingrui Wei, Ben Blaiszik, Aristana Scourtas, et al.
Physical Review Letters|August 1, 2015
Quantitative Measurement of Density in a Shear Band of Metallic Glass Monitored Along its Propagation DirectionVitalij Schmidt, Harald Rösner, Martin Peterlechner, et al.
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