Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Chiao-Jung Lin

Showing results (1-10 of 1) with videos related to

Pageof 1
Sort By:
Nanomaterials (Basel, Switzerland)|June 13, 2024
DC-free Method to Evaluate Nanoscale Equivalent Oxide Thickness: Dark-Mode Scanning Capacitance MicroscopyMao-Nan Chang, Yi-Shan Wu, Chiao-Jung Lin, et al.
Pageof 1

Showing results (1-10 of 1) with videos related to

Sort By:
Pageof 1
Nanomaterials (Basel, Switzerland)|June 13, 2024
DC-free Method to Evaluate Nanoscale Equivalent Oxide Thickness: Dark-Mode Scanning Capacitance MicroscopyMao-Nan Chang, Yi-Shan Wu, Chiao-Jung Lin, et al.
Pageof 1