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Applied Optics
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February 12, 2014
Improving optical properties of silicon nitride films to be applied in the middle infrared optics by a combined high-power impulse/unbalanced magnetron sputtering deposition technique
Bo-Huei Liao, Chien-Nan Hsiao
Nanoscale Research Letters
|
November 27, 2014
Interfacial atomic structure analysis at sub-angstrom resolution using aberration-corrected STEM
Chien-Nan Hsiao, Shou-Yi Kuo, Fang-I Lai, et al.
Applied Optics
|
April 1, 2020
Characterization of silicon oxynitride films deposited by a high-power impulse magnetron sputtering deposition technique
Bo-Huei Liao, Chien-Nan Hsiao, Ming-Hua Shiao, et al.
Nanoscale Research Letters
|
May 24, 2014
Effect of In/Al ratios on structural and optical properties of InAlN films grown on Si(100) by RF-MOMBE
Wei-Chun Chen, Yue-Han Wu, Chun-Yen Peng, et al.
Nanoscale Research Letters
|
June 16, 2012
Study of a sandwich structure of transparent conducting oxide films prepared by electron beam evaporation at room temperature
Po Kai Chiu, Wen Hao Cho, Hung Ping Chen, et al.
Journal of Nanoscience and Nanotechnology
|
May 29, 2012
Study of surface morphology control and investigation of hexagonal indium nitride nanorods grown on GaN/sapphire substrate
Shou-Yi Kuo, Wei-Chun Chen, Fang-I Lai, et al.
Small (Weinheim an Der Bergstrasse, Germany)
|
August 29, 2018
Synthesis of Large-Area InSe Monolayers by Chemical Vapor Deposition
Han-Ching Chang, Chien-Liang Tu, Kuang-I Lin, et al.
Scientific Reports
|
July 26, 2023
High-resolution three-dimensional structural determination of unstained double-gyroid block copolymers through scanning transmission electron microscopy
Ying Chen, Jhih-Heng Yang, Ya-Ting Chang, et al.
Nanoscale Research Letters
|
October 17, 2015
Facile Preparation of a Platinum Silicide Nanoparticle-Modified Tip Apex for Scanning Kelvin Probe Microscopy
Chun-Ting Lin, Yu-Wei Chen, James Su, et al.
Scientific Reports
|
January 3, 2024
Direct observation of single-atom defects in monolayer two-dimensional materials by using electron ptychography at 200 kV acceleration voltage
Ying Chen, Tzu-Chieh Chou, Ching-Hsing Fang, et al.
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of 2
Search research articles
Search
Showing results (1-10 of 19) with videos related to
Sort By:
Page
of 2
Applied Optics
|
February 12, 2014
Improving optical properties of silicon nitride films to be applied in the middle infrared optics by a combined high-power impulse/unbalanced magnetron sputtering deposition technique
Bo-Huei Liao, Chien-Nan Hsiao
Nanoscale Research Letters
|
November 27, 2014
Interfacial atomic structure analysis at sub-angstrom resolution using aberration-corrected STEM
Chien-Nan Hsiao, Shou-Yi Kuo, Fang-I Lai, et al.
Applied Optics
|
April 1, 2020
Characterization of silicon oxynitride films deposited by a high-power impulse magnetron sputtering deposition technique
Bo-Huei Liao, Chien-Nan Hsiao, Ming-Hua Shiao, et al.
Nanoscale Research Letters
|
May 24, 2014
Effect of In/Al ratios on structural and optical properties of InAlN films grown on Si(100) by RF-MOMBE
Wei-Chun Chen, Yue-Han Wu, Chun-Yen Peng, et al.
Nanoscale Research Letters
|
June 16, 2012
Study of a sandwich structure of transparent conducting oxide films prepared by electron beam evaporation at room temperature
Po Kai Chiu, Wen Hao Cho, Hung Ping Chen, et al.
Journal of Nanoscience and Nanotechnology
|
May 29, 2012
Study of surface morphology control and investigation of hexagonal indium nitride nanorods grown on GaN/sapphire substrate
Shou-Yi Kuo, Wei-Chun Chen, Fang-I Lai, et al.
Small (Weinheim an Der Bergstrasse, Germany)
|
August 29, 2018
Synthesis of Large-Area InSe Monolayers by Chemical Vapor Deposition
Han-Ching Chang, Chien-Liang Tu, Kuang-I Lin, et al.
Scientific Reports
|
July 26, 2023
High-resolution three-dimensional structural determination of unstained double-gyroid block copolymers through scanning transmission electron microscopy
Ying Chen, Jhih-Heng Yang, Ya-Ting Chang, et al.
Nanoscale Research Letters
|
October 17, 2015
Facile Preparation of a Platinum Silicide Nanoparticle-Modified Tip Apex for Scanning Kelvin Probe Microscopy
Chun-Ting Lin, Yu-Wei Chen, James Su, et al.
Scientific Reports
|
January 3, 2024
Direct observation of single-atom defects in monolayer two-dimensional materials by using electron ptychography at 200 kV acceleration voltage
Ying Chen, Tzu-Chieh Chou, Ching-Hsing Fang, et al.
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of 2