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Christina Hirschl

Showing results (1-10 of 5) with videos related to

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Sensors (Basel, Switzerland)|April 29, 2020
Evaluation of the Sheet Resistance of Inkjet-Printed Ag-Layers on Flexible, Uncoated Paper Substrates Using Van-der-Pauw's MethodJohanna Zikulnig, Ali Roshanghias, Lukas Rauter, et al.
Sensors (Basel, Switzerland)|April 25, 2020
Automatic Anomaly Detection on In-Production Manufacturing Machines Using Statistical Learning MethodsFederico Pittino, Michael Puggl, Thomas Moldaschl, et al.
Applied Spectroscopy|October 29, 2013
Non-destructive determination of ethylene vinyl acetate cross-linking in photovoltaic (PV) modules by Raman spectroscopyBoril S Chernev, Christina Hirschl, Gabriele C Eder
Sensors (Basel, Switzerland)|January 26, 2019
Characterization of a Robust 3D- and Inkjet-Printed Capacitive Position Sensor for a Spectrometer ApplicationLisa-Marie Faller, Martin Lenzhofer, Christina Hirschl, et al.
Sensors (Basel, Switzerland)|June 2, 2021
Statistical Methods for Degradation Estimation and Anomaly Detection in Photovoltaic PlantsVesna Dimitrievska, Federico Pittino, Wolfgang Muehleisen, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Sensors (Basel, Switzerland)|April 29, 2020
Evaluation of the Sheet Resistance of Inkjet-Printed Ag-Layers on Flexible, Uncoated Paper Substrates Using Van-der-Pauw's MethodJohanna Zikulnig, Ali Roshanghias, Lukas Rauter, et al.
Sensors (Basel, Switzerland)|April 25, 2020
Automatic Anomaly Detection on In-Production Manufacturing Machines Using Statistical Learning MethodsFederico Pittino, Michael Puggl, Thomas Moldaschl, et al.
Applied Spectroscopy|October 29, 2013
Non-destructive determination of ethylene vinyl acetate cross-linking in photovoltaic (PV) modules by Raman spectroscopyBoril S Chernev, Christina Hirschl, Gabriele C Eder
Sensors (Basel, Switzerland)|January 26, 2019
Characterization of a Robust 3D- and Inkjet-Printed Capacitive Position Sensor for a Spectrometer ApplicationLisa-Marie Faller, Martin Lenzhofer, Christina Hirschl, et al.
Sensors (Basel, Switzerland)|June 2, 2021
Statistical Methods for Degradation Estimation and Anomaly Detection in Photovoltaic PlantsVesna Dimitrievska, Federico Pittino, Wolfgang Muehleisen, et al.
Pageof 1