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Ultramicroscopy|August 26, 2023
Reliable phase quantification in focused probe electron ptychography of thin materialsChristoph Hofer, Timothy J Pennycook
Journal of Microscopy|March 21, 2025
Detecting charge transfer at defects in 2D materials with electron ptychographyChristoph Hofer, Jacob Madsen, Toma Susi, et al.
Ultramicroscopy|January 13, 2024
Phase offset method of ptychographic contrast reversal correctionChristoph Hofer, Chuang Gao, Tamazouzt Chennit, et al.
Nature Communications|October 11, 2016
Isotope analysis in the transmission electron microscopeToma Susi, Christoph Hofer, Giacomo Argentero, et al.
Nature Communications|August 31, 2017
Corrigendum: Isotope analysis in the transmission electron microscopeToma Susi, Christoph Hofer, Giacomo Argentero, et al.
Ultramicroscopy|August 27, 2025
Improving the low-dose performance of aberration correction in single sideband ptychographySongge Li, Nicolas Gauquelin, Hoelen L Lalandec Robert, et al.
Ultramicroscopy|September 28, 2025
Investigating the convergence properties of iterative ptychography for atomic-resolution low-dose imagingTamazouzt Chennit, Songge Li, Hoelen L Lalandec Robert, et al.
Nature|October 30, 2025
Atomically resolved edges and defects in lead halide perovskitesBiao Yuan, Zeyu Wang, Shuchen Zhang, et al.
Ultramicroscopy|March 28, 2021
ab initio description of bonding for transmission electron microscopyJacob Madsen, Timothy J Pennycook, Toma Susi
Ultramicroscopy|December 8, 2014
Efficient phase contrast imaging in STEM using a pixelated detector. Part II: optimisation of imaging conditionsHao Yang, Timothy J Pennycook, Peter D Nellist
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