Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Christopher K Anand

Showing results (1-10 of 2) with videos related to

Pageof 1
Sort By:
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 8, 2018
Multi-Angle Plasma Focused Ion Beam (FIB) Curtaining Artifact Correction Using a Fourier-Based Linear Optimization ModelChristopher W Schankula, Christopher K Anand, Nabil D Bassim
Magnetic Resonance in Chemistry : MRC|July 1, 2010
Problems, artifacts and solutions in the INADEQUATE NMR experimentAlex D Bain, Donald W Hughes, Christopher K Anand, et al.
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 8, 2018
Multi-Angle Plasma Focused Ion Beam (FIB) Curtaining Artifact Correction Using a Fourier-Based Linear Optimization ModelChristopher W Schankula, Christopher K Anand, Nabil D Bassim
Magnetic Resonance in Chemistry : MRC|July 1, 2010
Problems, artifacts and solutions in the INADEQUATE NMR experimentAlex D Bain, Donald W Hughes, Christopher K Anand, et al.
Pageof 1