Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Ions as Acids and Bases02:54

Ions as Acids and Bases

26.4K
Salts with Acidic Ions
Salts are ionic compounds composed of cations and anions, either of which may be capable of undergoing an acid or base ionization reaction with water. Aqueous salt solutions, therefore, may be acidic, basic, or neutral, depending on the relative acid-base strengths of the salt’s constituent ions. For example, dissolving the ammonium chloride in water results in its dissociation, as described by the equation:
26.4K
Masonry Curtain Walls01:20

Masonry Curtain Walls

1.8K
Masonry curtain walls employ brick or stone veneers supported by the building's structure to form an external cladding system that is both aesthetically appealing and functional. These walls are erected through two principal techniques, first by traditional layering of masonry units and second by using prefabricated panels. Traditional construction relies on steel shelf angles attached to the spandrel beam for support, with high-bond mortars ensuring secure attachment of masonry veneer...
1.8K
Distance Corrections01:15

Distance Corrections

290
To achieve precise distance measurements, especially in surveying and construction, certain corrections must be applied to account for potential sources of error like the standardization errors, temperature variations, and slope adjustments.Standardization error emerges when measurement equipment undergoes changes, such as wear, repairs, or weather impacts. To address this, surveyors compare the equipment’s readings to a standard. This process identifies any deviation that might lead to...
290
Common Ion Effect03:24

Common Ion Effect

46.7K
Compared with pure water, the solubility of an ionic compound is less in aqueous solutions containing a common ion (one also produced by dissolution of the ionic compound). This is an example of a phenomenon known as the common ion effect, which is a consequence of the law of mass action that may be explained using Le Châtelier’s principle. Consider the dissolution of silver iodide:
46.7K
Beams01:30

Beams

1.9K
Beams are integral components of structural engineering and construction, designed to support loads applied at various points along their length. These long, straight members can be classified based on geometry, cross-section, support type, and equilibrium condition.
Based on geometry, beams can be straight, tapered, or curved. Straight beams are the most common type and have a constant cross-section throughout their length. Tapered beams, on the other hand, have a varying cross-section along...
1.9K
Power Factor Correction01:20

Power Factor Correction

540
The power transmission to a factory involves the transfer of apparent power, a combination of active and reactive power. The power factor measures how effectively electrical power is converted into useful work output. The ratio of the real power (KW) that does the work to the apparent power (KVA) supplied to the circuit.
540

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Millimeter-Scale Single-Crystal α-MoO<sub>3</sub> Nanosheets Grown by Alkali Salt-Assisted Chemical Vapor Deposition.

ACS nano·2026
Same author

Controlled Growth of Rare-Earth-Doped TiO<sub>2</sub> Thin Films on III-V Semiconductors for Hybrid Quantum Photonic Interfaces.

ACS applied optical materials·2026
Same author

Engineering Nanohole-Etched Quantum Dots for Telecom-Band Single-Photon Generation.

ACS nano·2026
Same author

High-energy resolution monochromated STEM-EELS mapping across large areas.

Ultramicroscopy·2025
Same author

Nanoscale Infrared Spectroscopic Characterization of Extended Defects in 4H-Silicon Carbide.

Nano letters·2024
Same author

Elucidating the Mechanism of Large Phosphate Molecule Intercalation Through Graphene-Substrate Heterointerfaces.

ACS applied materials & interfaces·2023

Related Experiment Video

Updated: Feb 1, 2026

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes
13:49

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes

Published on: January 19, 2020

7.2K

Multi-Angle Plasma Focused Ion Beam (FIB) Curtaining Artifact Correction Using a Fourier-Based Linear Optimization

Christopher W Schankula1, Christopher K Anand1, Nabil D Bassim2

  • 11Department of Computing and Software,McMaster University,1280 Main St. W, Hamilton, ON L8S 4L8,Canada.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|December 8, 2018
PubMed
Summary

We developed a new model to fix image artifacts in plasma focused ion beam scanning electron microscopy (PFIB-SEM). This method corrects multi-angle curtaining effects, improving 3D imaging for materials science.

More Related Videos

Focused Ion Beam Fabrication of LiPON-based Solid-state Lithium-ion Nanobatteries for In Situ Testing
10:58

Focused Ion Beam Fabrication of LiPON-based Solid-state Lithium-ion Nanobatteries for In Situ Testing

Published on: March 7, 2018

10.7K
Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
08:20

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

Published on: October 25, 2021

4.0K

Related Experiment Videos

Last Updated: Feb 1, 2026

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes
13:49

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes

Published on: January 19, 2020

7.2K
Focused Ion Beam Fabrication of LiPON-based Solid-state Lithium-ion Nanobatteries for In Situ Testing
10:58

Focused Ion Beam Fabrication of LiPON-based Solid-state Lithium-ion Nanobatteries for In Situ Testing

Published on: March 7, 2018

10.7K
Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
08:20

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

Published on: October 25, 2021

4.0K

Area of Science:

  • Materials Science and Engineering
  • Microscopy and Imaging Techniques
  • Computational Modeling and Data Analysis

Background:

  • Plasma Focused Ion Beam Scanning Electron Microscopy (PFIB-SEM) enables rapid 3D volume imaging at the nanoscale.
  • Rocking-polishing techniques in PFIB-SEM reduce deep surface artifacts but introduce shallow, two-angle curtaining artifacts.
  • These artifacts hinder accurate microstructural quantification and automated image processing in serial sectioning tomography.

Purpose of the Study:

  • To present a flexible linear optimization model for correcting multi-angle curtaining artifacts in PFIB-SEM images.
  • To enable accurate microstructural quantification by removing image distortions.
  • To provide a robust method for processing large 3D datasets generated by PFIB-SEM.

Main Methods:

  • Development of a Fourier-based linear optimization model specifically targeting two discrete curtaining angles.
  • Application of the model to PFIB-SEM tomograms, including data from a heterogeneous concrete sample.
  • Methods for user-guided parameter selection to optimize artifact correction based on specific imaging goals.

Main Results:

  • The proposed model effectively corrects multi-angle curtaining artifacts without introducing new image distortions.
  • Non-curtain structures and void contrast remain unmodified, preserving essential microstructural information.
  • The algorithm demonstrates superior performance compared to previous methods in multi-angle curtain correction.

Conclusions:

  • The developed linear optimization model offers an effective solution for PFIB-SEM curtaining artifacts.
  • This method enhances the reliability of automated image processing and quantitative analysis of 3D microstructures.
  • The algorithm is designed for easy parallelization, facilitating efficient processing on multi-core hardware.