Uncertainty-Aware Semantic Segmentation of Serial Block-Face Scanning Electron Microscopy Images and

Junhyeong Park1, Dal-Jae Yun2, Youngkwon Haam1,3

  • 1Emerging Research Instruments Group, Strategic Technology Research Institute, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu, Daejeon 34113, Republic of Korea.

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