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Chun-Guang Ban

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Journal of Microscopy|May 25, 2023

Optimized dopant imaging for GaN by a scanning electron microscopyKai Zhang, Chun-Guang Ban, Ye Yuan, et al.

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Search research articles

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Journal of Microscopy|May 25, 2023

Optimized dopant imaging for GaN by a scanning electron microscopyKai Zhang, Chun-Guang Ban, Ye Yuan, et al.

Pageof 1