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Materials (Basel, Switzerland)|August 10, 2017
Characterization of High-k Nanolayers by Grazing Incidence X-ray SpectrometryMatthias Müller, Philipp Hönicke, Blanka Detlefs, et al.
Ultramicroscopy|September 15, 2018
Revealing the 3-dimensional shape of atom probe tips by atomic force microscopyClaudia Fleischmann, Kristof Paredis, Davit Melkonyan, et al.
Nanotechnology|May 20, 2025
Nanoscale spectroscopic investigation of impact of strain on field-effect mobility of WS2Fateme Yekefalah, Thomas Nuytten, Kaustuv Banerjee, et al.
Analytical Chemistry|July 16, 2020
A Correlative ToF-SIMS/SPM Methodology for Probing 3D DevicesValentina Spampinato, Masoud Dialameh, Alexis Franquet, et al.
ACS Applied Materials & Interfaces|February 5, 2026
Detection and Modulation of Gap States at the Grain Boundaries of Monolayer WS2Fateme Yekefalah, Albert Minj, Ankit Nalin Mehta, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 6, 2024
Influence of the Emitter Shape on the Field-of-View in Atom Probe TomographyMasoud Dialameh, Yu-Ting Ling, Janusz Bogdanowicz, et al.
Ultramicroscopy|January 10, 2020
Potential sources of compositional inaccuracy in the atom probe tomography of InxGa1-xAsRamya Cuduvally, Richard J H Morris, Piero Ferrari, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 28, 2022
A Bottom-Up Volume Reconstruction Method for Atom Probe TomographyYu-Ting Ling, Siegfried Cools, Janusz Bogdanowicz, et al.
Ultramicroscopy|August 21, 2022
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlNRichard J H Morris, Ramya Cuduvally, Jhao-Rong Lin, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 12, 2025
A Statistical Approach for Evaluating the Spatial Distribution and Local Atomic Environment of Dopants Using Atom Probe TomographyJhao-Rong Lin, Richard J H Morris, Jeroen E Scheerder, et al.
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