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Ultramicroscopy|September 15, 2018
Revealing the 3-dimensional shape of atom probe tips by atomic force microscopyClaudia Fleischmann, Kristof Paredis, Davit Melkonyan, et al.
Ultramicroscopy|January 10, 2020
Potential sources of compositional inaccuracy in the atom probe tomography of InxGa1-xAsRamya Cuduvally, Richard J H Morris, Piero Ferrari, et al.
Ultramicroscopy|July 14, 2019
Carrier profiling with fast Fourier transform scanning spreading resistance microscopy: A case study for Ge, GaAs, InGaAs, and InPOberon Dixon-Luinenburg, Umberto Celano, Wilfried Vandervorst, et al.
Scientific Reports|September 11, 2020
The impact of focused ion beam induced damage on scanning spreading resistance microscopy measurementsKomal Pandey, Kristof Paredis, Thomas Hantschel, et al.
Ultramicroscopy|July 28, 2019
Atom probe of GaN/AlGaN heterostructures: The role of electric field, sample crystallography and laser excitation on quantificationRichard J H Morris, Ramya Cuduvally, Davit Melkonyan, et al.
Nanotechnology|March 29, 2019
Effects of buried grain boundaries in multilayer MoS2Jonathan Ludwig, Ankit Nalin Mehta, Marco Mascaro, et al.
Scientific Reports|February 16, 2018
Mesoscopic physical removal of material using sliding nano-diamond contactsUmberto Celano, Feng-Chun Hsia, Danielle Vanhaeren, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 6, 2024
Influence of the Emitter Shape on the Field-of-View in Atom Probe TomographyMasoud Dialameh, Yu-Ting Ling, Janusz Bogdanowicz, et al.
Analytical Chemistry|July 16, 2020
A Correlative ToF-SIMS/SPM Methodology for Probing 3D DevicesValentina Spampinato, Masoud Dialameh, Alexis Franquet, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 28, 2022
A Bottom-Up Volume Reconstruction Method for Atom Probe TomographyYu-Ting Ling, Siegfried Cools, Janusz Bogdanowicz, et al.
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