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Ultramicroscopy|August 21, 2022
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlNRichard J H Morris, Ramya Cuduvally, Jhao-Rong Lin, et al.Scientific Reports|April 9, 2021
Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport propertiesJoão Resende, Van-Son Nguyen, Claudia Fleischmann, et al.Ultramicroscopy|March 19, 2013
3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomographyAjay Kumar Kambham, Arul Kumar, Matthieu Gilbert, et al.Nanotechnology|June 15, 2013
Three-dimensional doping and diffusion in nano scaled devices as studied by atom probe tomographyAjay Kumar Kambham, Arul Kumar, Antonios Florakis, et al.Nanotechnology|August 3, 2018
Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformityDaniele Chiappe, Jonathan Ludwig, Alessandra Leonhardt, et al.Ultramicroscopy|September 9, 2015
Mapping interfacial excess in atom probe dataPeter Felfer, Barbara Scherrer, Jelle Demeulemeester, et al.Optics Express|April 1, 2020
Size-dependent optical properties of periodic arrays of semiconducting nanolinesAndrzej Gawlik, Janusz Bogdanowicz, Andreas Schulze, et al.Analytical Sciences : the International Journal of the Japan Society for Analytical Chemistry|February 11, 2010
Analysis of ultra-thin HfO(2)/SiON/Si(001): comparison of three different techniquesKenji Kimura, Kaoru Nakajima, Thierry Conard, et al.Journal of the American Chemical Society|July 28, 2011
Evolution of the structure and chemical state of Pd nanoparticles during the in situ catalytic reduction of NO with H2Kristof Paredis, Luis K Ono, Farzad Behafarid, et al.The Journal of Physical Chemistry Letters|August 12, 2015
Understanding the Dual Nature of the Filament Dissolution in Conductive Bridging DevicesUmberto Celano, Ludovic Goux, Attilio Belmonte, et al.Pageof 5