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Optics Express|August 5, 2014
Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopyPeter Hermann, Arne Hoehl, Georg Ulrich, et al.
Scientific Reports|April 9, 2021
Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport propertiesJoão Resende, Van-Son Nguyen, Claudia Fleischmann, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 17, 2024
Significant Oxygen Underestimation When Quantifying Barium-Doped SrTiO Layers by Atom Probe TomographyRichard J H Morris, Jhao-Rong Lin, Jeroen E Scheerder, et al.
Small (Weinheim an Der Bergstrasse, Germany)|November 25, 2021
Simultaneous Dimensional and Analytical Characterization of Ordered NanostructuresPhilipp Hönicke, Yves Kayser, Konstantin V Nikolaev, et al.
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