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Clemens Barth

Showing results (1-10 of 16) with videos related to

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Physical Review Letters|March 21, 2008
Imaging Suzuki precipitates on NaCl : Mg2+ (001) by scanning force microscopyClemens Barth, Claude R Henry
Nanotechnology|July 6, 2011
Kelvin probe force microscopy on surfaces of UHV cleaved ionic crystalsClemens Barth, Claude R Henry
Physical Review Letters|May 16, 2007
Surface double layer on (001) surfaces of alkali halide crystals: a scanning force microscopy studyClemens Barth, Claude R Henry
Physical Review Letters|November 13, 2003
Atomic resolution imaging of the (001) surface of UHV cleaved MgO by dynamic scanning force microscopyClemens Barth, Claude R Henry
Nanoscale|December 1, 2015
Charging C60 islands with the AFM tipBrice Hoff, Claude R Henry, Clemens Barth
Journal of Physics. Condensed Matter : an Institute of Physics Journal|September 15, 2021
High-temperature oxidation and reduction of the inverse ceria/Cu(111) catalyst characterized by LEED, STM, nc-AFM and KPFMAli El Barraj, Baptiste Chatelain, Clemens Barth
Scientific Reports|February 5, 2015
KCl ultra-thin films with polar and non-polar surfaces grown on Si(111)7 × 7Igor Beinik, Clemens Barth, Margrit Hanbücken, et al.
Physical Review Letters|August 8, 2009
Chemical identification of ions in doped NaCl by scanning force microscopyAdam S Foster, Clemens Barth, Claude R Henry
Scientific Reports|February 23, 2013
Defect mediated manipulation of nanoclusters on an insulatorTeemu Hynninen, Gregory Cabailh, Adam S Foster, et al.
Advanced Materials (Deerfield Beach, Fla.)|January 22, 2011
Recent trends in surface characterization and chemistry with high-resolution scanning force methodsClemens Barth, Adam S Foster, Claude R Henry, et al.
Pageof 2

Showing results (1-10 of 16) with videos related to

Sort By:
Pageof 2
Physical Review Letters|March 21, 2008
Imaging Suzuki precipitates on NaCl : Mg2+ (001) by scanning force microscopyClemens Barth, Claude R Henry
Nanotechnology|July 6, 2011
Kelvin probe force microscopy on surfaces of UHV cleaved ionic crystalsClemens Barth, Claude R Henry
Physical Review Letters|May 16, 2007
Surface double layer on (001) surfaces of alkali halide crystals: a scanning force microscopy studyClemens Barth, Claude R Henry
Physical Review Letters|November 13, 2003
Atomic resolution imaging of the (001) surface of UHV cleaved MgO by dynamic scanning force microscopyClemens Barth, Claude R Henry
Nanoscale|December 1, 2015
Charging C60 islands with the AFM tipBrice Hoff, Claude R Henry, Clemens Barth
Journal of Physics. Condensed Matter : an Institute of Physics Journal|September 15, 2021
High-temperature oxidation and reduction of the inverse ceria/Cu(111) catalyst characterized by LEED, STM, nc-AFM and KPFMAli El Barraj, Baptiste Chatelain, Clemens Barth
Scientific Reports|February 5, 2015
KCl ultra-thin films with polar and non-polar surfaces grown on Si(111)7 × 7Igor Beinik, Clemens Barth, Margrit Hanbücken, et al.
Physical Review Letters|August 8, 2009
Chemical identification of ions in doped NaCl by scanning force microscopyAdam S Foster, Clemens Barth, Claude R Henry
Scientific Reports|February 23, 2013
Defect mediated manipulation of nanoclusters on an insulatorTeemu Hynninen, Gregory Cabailh, Adam S Foster, et al.
Advanced Materials (Deerfield Beach, Fla.)|January 22, 2011
Recent trends in surface characterization and chemistry with high-resolution scanning force methodsClemens Barth, Adam S Foster, Claude R Henry, et al.
Pageof 2