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Colin Ophus

Showing results (11-20 of 156) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 6, 2021
Deep Learning Segmentation of Complex Features in Atomic-Resolution Phase-Contrast Transmission Electron Microscopy ImagesRobbie Sadre, Colin Ophus, Anastasiia Butko, et al.
Journal of Microscopy|February 14, 2024
A method for crystallographic mapping of an alpha-beta titanium alloy with nanometre resolution using scanning precession electron diffraction and open-source software librariesIan MacLaren, Enrique Frutos-Myro, Steven Zeltmann, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 12, 2025
Multi-angle Precession Electron Diffraction (MAPED): A Versatile Approach to 4D-STEM PrecessionStephanie M Ribet, Rohan Dhall, Colin Ophus, et al.
Nature Communications|June 16, 2026
Staging and defect-limited intercalation of FeCl<sub>3</sub> in graphite electrodesPeter Schweizer, Lilian M Vogl, Colin Ophus, et al.
Ultramicroscopy|June 16, 2018
Towards bend-contour-free dislocation imaging via diffraction contrast STEMYuanyuan Zhu, Colin Ophus, Mychailo B Toloczko, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 13, 2024
Digital Dark Field-Higher Contrast and Greater Specificity Dark Field Imaging Using a 4DSTEM ApproachIan MacLaren, Andrew T Fraser, Matthew R Lipsett, et al.
Journal of Microscopy|April 8, 2025
Accelerating iterative ptychography with an integrated neural networkArthur R C McCray, Stephanie M Ribet, Georgios Varnavides, et al.
Advanced Structural and Chemical Imaging|December 23, 2016
Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samplesColin Ophus, Haider I Rasool, Martin Linck, et al.
Small (Weinheim an Der Bergstrasse, Germany)|November 18, 2020
1D to 2D Transition in Tellurium Observed by 4D Electron MicroscopyAlejandra Londoño-Calderon, Darrick J Williams, Colin Ophus, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 28, 2023
Measurement of Atomic Modulation Direction Using the Azimuthal Variation of First-Order Laue Zone Electron DiffractionAurys Silinga, Christopher S Allen, Juri Barthel, et al.
Pageof 16

Showing results (11-20 of 156) with videos related to

Sort By:
Pageof 16
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 6, 2021
Deep Learning Segmentation of Complex Features in Atomic-Resolution Phase-Contrast Transmission Electron Microscopy ImagesRobbie Sadre, Colin Ophus, Anastasiia Butko, et al.
Journal of Microscopy|February 14, 2024
A method for crystallographic mapping of an alpha-beta titanium alloy with nanometre resolution using scanning precession electron diffraction and open-source software librariesIan MacLaren, Enrique Frutos-Myro, Steven Zeltmann, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 12, 2025
Multi-angle Precession Electron Diffraction (MAPED): A Versatile Approach to 4D-STEM PrecessionStephanie M Ribet, Rohan Dhall, Colin Ophus, et al.
Nature Communications|June 16, 2026
Staging and defect-limited intercalation of FeCl<sub>3</sub> in graphite electrodesPeter Schweizer, Lilian M Vogl, Colin Ophus, et al.
Ultramicroscopy|June 16, 2018
Towards bend-contour-free dislocation imaging via diffraction contrast STEMYuanyuan Zhu, Colin Ophus, Mychailo B Toloczko, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 13, 2024
Digital Dark Field-Higher Contrast and Greater Specificity Dark Field Imaging Using a 4DSTEM ApproachIan MacLaren, Andrew T Fraser, Matthew R Lipsett, et al.
Journal of Microscopy|April 8, 2025
Accelerating iterative ptychography with an integrated neural networkArthur R C McCray, Stephanie M Ribet, Georgios Varnavides, et al.
Advanced Structural and Chemical Imaging|December 23, 2016
Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samplesColin Ophus, Haider I Rasool, Martin Linck, et al.
Small (Weinheim an Der Bergstrasse, Germany)|November 18, 2020
1D to 2D Transition in Tellurium Observed by 4D Electron MicroscopyAlejandra Londoño-Calderon, Darrick J Williams, Colin Ophus, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 28, 2023
Measurement of Atomic Modulation Direction Using the Azimuthal Variation of First-Order Laue Zone Electron DiffractionAurys Silinga, Christopher S Allen, Juri Barthel, et al.
Pageof 16