Interference and Diffraction
Topographic Surveying and Contours
Bending
Symmetric Member in Bending
Unsymmetric Bending
Bending of Members Made of Several Materials
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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on: July 17, 2015
Yuanyuan Zhu1, Colin Ophus2, Mychailo B Toloczko1
1Energy and Environment Directorate, Nuclear Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99352, USA.
Diffraction contrast imaging scanning transmission electron microscopy (DCI STEM) offers superior dislocation imaging by minimizing artifacts. Specific STEM angles are crucial for bend-contour-free defect analysis in metals.
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