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D A Muller

Showing results (1-10 of 37) with videos related to

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Journal of Electron Microscopy|July 27, 2001
Optimizing the environment for sub-0.2 nm scanning transmission electron microscopyD A Muller, J Grazul
Ultramicroscopy|November 12, 2002
Fluctuation microscopy in the STEMP M Voyles, D A Muller
Ultramicroscopy|October 9, 2007
Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfacesZ Yu, D A Muller, J Silcox
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Depth-dependent imaging of individual dopant atoms in siliconP M Voyles, D A Muller, E J Kirkland
Ultramicroscopy|July 23, 2003
Imaging individual atoms inside crystals with ADF-STEMP M Voyles, J L Grazul, D A Muller
Ultramicroscopy|April 3, 2001
Simulation of thermal diffuse scattering including a detailed phonon dispersion curveD A Muller, B Edwards, E J Kirkland, et al.
Nature|September 28, 2002
Artificial charge-modulationin atomic-scale perovskite titanate superlatticesA Ohtomo, D A Muller, J L Grazul, et al.
Ultramicroscopy|July 27, 2006
Subtleties in ADF imaging and spatially resolved EELS: A case study of low-angle twist boundaries in SrTiO3L Fitting, S Thiel, A Schmehl, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
The formation of clusters and nanocrystals in er-implanted hexagonal silicon carbideU Kaiser, D A Muller, A Chuvilin, et al.
Nature Materials|March 6, 2003
Direct observation of defect-mediated cluster nucleationU Kaiser, D A Muller, J L Grazul, et al.
Pageof 4

Showing results (1-10 of 37) with videos related to

Sort By:
Pageof 4
Journal of Electron Microscopy|July 27, 2001
Optimizing the environment for sub-0.2 nm scanning transmission electron microscopyD A Muller, J Grazul
Ultramicroscopy|November 12, 2002
Fluctuation microscopy in the STEMP M Voyles, D A Muller
Ultramicroscopy|October 9, 2007
Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfacesZ Yu, D A Muller, J Silcox
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Depth-dependent imaging of individual dopant atoms in siliconP M Voyles, D A Muller, E J Kirkland
Ultramicroscopy|July 23, 2003
Imaging individual atoms inside crystals with ADF-STEMP M Voyles, J L Grazul, D A Muller
Ultramicroscopy|April 3, 2001
Simulation of thermal diffuse scattering including a detailed phonon dispersion curveD A Muller, B Edwards, E J Kirkland, et al.
Nature|September 28, 2002
Artificial charge-modulationin atomic-scale perovskite titanate superlatticesA Ohtomo, D A Muller, J L Grazul, et al.
Ultramicroscopy|July 27, 2006
Subtleties in ADF imaging and spatially resolved EELS: A case study of low-angle twist boundaries in SrTiO3L Fitting, S Thiel, A Schmehl, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
The formation of clusters and nanocrystals in er-implanted hexagonal silicon carbideU Kaiser, D A Muller, A Chuvilin, et al.
Nature Materials|March 6, 2003
Direct observation of defect-mediated cluster nucleationU Kaiser, D A Muller, J L Grazul, et al.
Pageof 4