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Scanning|August 21, 2003
Experimental resolution measurement in critical dimension scanning electron microscope metrologyG F Lorusso, D C JoyUltramicroscopy|June 24, 2016
Monte Carlo modeling of ion beam induced secondary electronsU Huh, W Cho, D C JoyJournal of Microscopy|July 3, 2004
Experimental secondary electron spectra under SEM conditionsD C Joy, M S Prasad, H M MeyerJournal of Electron Microscopy Technique|January 1, 1990
High resolution SE-I SEM study of enamel crystal morphologyR P Apkarian, M D Gutekunst, D C JoyScientific Reports|August 30, 2018
Biological serial block face scanning electron microscopy at improved z-resolution based on Monte Carlo modelQ He, M Hsueh, G Zhang, et al.Journal of Microscopy|August 8, 2009
Diverse and conserved nano- and mesoscale structures of diatom silica revealed by atomic force microscopyM Hildebrand, G Holton, D C Joy, et al.Science (New York, N.Y.)|May 5, 1978
Fluorinated molecule as a tracer: difluoroserotonin in human platelets mapped by electron energy-loss spectroscopyJ L Costa, D C Joy, D M Maher, et al.Journal of the American Society for Mass Spectrometry|August 13, 2016
Effects of molecular entanglements during electrospray of high molecular weight polymersR Festag, S D Alexandratos, D C Joy, et al.Scanning|September 26, 1997
Imaging thin and thick sections of biological tissue with the secondary electron detector in a field-emission scanning electron microscopeW P Wergin, R W Yaklich, S Roy, et al.Pageof 3