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Physical Review Letters|June 1, 2004
Probing nanoscale dipole-dipole interactions by electric force microscopyT Mélin, H Diesinger, D Deresmes, et al.Ultramicroscopy|November 27, 2009
Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuumH Diesinger, D Deresmes, J-P Nys, et al.Ultramicroscopy|March 18, 2008
Kelvin force microscopy at the second cantilever resonance: an out-of-vacuum crosstalk compensation setupH Diesinger, D Deresmes, J-P Nys, et al.The Review of Scientific Instruments|April 5, 2011
Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopyT Mélin, S Barbet, H Diesinger, et al.Journal of Colloid and Interface Science|May 9, 2006
Langmuir-Blodgett monolayers of InP quantum dots with short chain ligandsK Lambert, L Wittebrood, I Moreels, et al.Science (New York, N.Y.)|December 15, 2007
Probing the carrier capture rate of a single quantum levelM Berthe, R Stiufiuc, B Grandidier, et al.Physical Review Letters|February 9, 2005
Direct evidence for shallow acceptor states with nonspherical symmetry in GaAsG Mahieu, B Grandidier, D Deresmes, et al.Physical Review Letters|July 13, 2004
Semiconducting surface reconstructions of p-type Si(100) substrates at 5 KL Perdigão, D Deresmes, B Grandidier, et al.Journal of Colloid and Interface Science|May 21, 2013
Toward the understanding of the interfacial dairy fouling deposition and growth mechanisms at a stainless steel surface: a multiscale approachM Jimenez, G Delaplace, N Nuns, et al.Physical Review Letters|December 13, 2006
Electron transport via local polarons at interface atomsM Berthe, A Urbieta, L Perdigão, et al.Pageof 1