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January 6, 2001
Measures for spectral quality in low-voltage X-ray microanalysis
D E Newbury
Journal of Microscopy
|
November 2, 2004
Maximum pixel spectrum: a new tool for detecting and recovering rare, unanticipated features from spectrum image data cubes
D S Bright, D E Newbury
Analytical Chemistry
|
September 15, 1993
Trace elemental analysis at nanometer spatial resolution by parallel-detection electron energy loss spectroscopy
R D Leapman, D E Newbury
Scanning Electron Microscopy
|
January 1, 1980
Artifacts in energy dispersive x-ray spectrometry in the scanning electron microscope (II)
C E Fiori, D E Newbury
Journal of Microscopy
|
March 21, 1998
Visibility of objects in computer simulations of noisy micrographs
D S Bright, D E Newbury, E B Steel
Analytical Chemistry
|
June 1, 1995
"Standardless" quantitative electron probe microanalysis with energy-dispersive X-ray spectrometry: is it worth the risk?
D E Newbury, C R Swyt, R L Myklebust
Journal of Microscopy
|
November 1, 1984
On the use of ionization cross sections in analytical electron microscopy
D B Williams, D E Newbury, J I Goldstein, et al.
Scanning Electron Microscopy
|
January 1, 1979
Raman microprobe studies of two mineralizing tissues: enamel of the rat incisor and the embryonic chick tibia
F S Casciani, E S Etz, D E Newbury, et al.
Proceedings of the National Academy of Sciences of the United States of America
|
November 10, 2010
Postdetonation nuclear debris for attribution
A J Fahey, C J Zeissler, D E Newbury, et al.
Metallurgical and Materials Transactions. A. Physical Metallurgy and Materials Science
|
October 16, 2020
Solidification of Ni-Re Peritectic Alloys
W J Boettinger, D E Newbury, N W M Ritchie, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 10) with videos related to
Sort By:
Page
of 1
Scanning
|
January 6, 2001
Measures for spectral quality in low-voltage X-ray microanalysis
D E Newbury
Journal of Microscopy
|
November 2, 2004
Maximum pixel spectrum: a new tool for detecting and recovering rare, unanticipated features from spectrum image data cubes
D S Bright, D E Newbury
Analytical Chemistry
|
September 15, 1993
Trace elemental analysis at nanometer spatial resolution by parallel-detection electron energy loss spectroscopy
R D Leapman, D E Newbury
Scanning Electron Microscopy
|
January 1, 1980
Artifacts in energy dispersive x-ray spectrometry in the scanning electron microscope (II)
C E Fiori, D E Newbury
Journal of Microscopy
|
March 21, 1998
Visibility of objects in computer simulations of noisy micrographs
D S Bright, D E Newbury, E B Steel
Analytical Chemistry
|
June 1, 1995
"Standardless" quantitative electron probe microanalysis with energy-dispersive X-ray spectrometry: is it worth the risk?
D E Newbury, C R Swyt, R L Myklebust
Journal of Microscopy
|
November 1, 1984
On the use of ionization cross sections in analytical electron microscopy
D B Williams, D E Newbury, J I Goldstein, et al.
Scanning Electron Microscopy
|
January 1, 1979
Raman microprobe studies of two mineralizing tissues: enamel of the rat incisor and the embryonic chick tibia
F S Casciani, E S Etz, D E Newbury, et al.
Proceedings of the National Academy of Sciences of the United States of America
|
November 10, 2010
Postdetonation nuclear debris for attribution
A J Fahey, C J Zeissler, D E Newbury, et al.
Metallurgical and Materials Transactions. A. Physical Metallurgy and Materials Science
|
October 16, 2020
Solidification of Ni-Re Peritectic Alloys
W J Boettinger, D E Newbury, N W M Ritchie, et al.
Page
of 1