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Applied Optics|March 12, 2010
Infrared propagation and performance modeling at the Electro-Optical Test FacilityD G Crowe, D K Cohen, E L DereniakApplied Optics|April 8, 2010
Derivation of the effect of atmospheric and aerosol emissions on IR imaging device performanceD G Crowe, D K Cohen, E L DereniakApplied Optics|April 17, 2010
Characteristics of a chamber used for electrooptical device performance measurements in the presence of fogD K Cohen, J H Hunt, D G CroweApplied Optics|February 4, 2010
Application of a synthetic aperture optical system to infrared imagingE L DereniakApplied Optics|August 21, 2010
Error-free image compression algorithm using classifying-sequencing techniquesJ D He, E L DereniakApplied Optics|January 23, 2010
A comparison of the theoretical operation of high-impedance and low-impedance detectorsE L Dereniak, W L WolfeApplied Optics|June 18, 2010
Extrinsic silicon photodetector characterizationJ P Garcia, E L DereniakApplied Optics|March 6, 2008
Mixed-expectation image-reconstruction techniqueJ P Garcia, E L DereniakApplied Optics|August 12, 2010
Measurement of the index of refraction of the plastic Phenoxy PKFEK Kuhler, E L Dereniak, M BuchananApplied Optics|March 25, 2010
Bidirectional reflectance distribution function of gold-plated sandpaperT W Stuhlinger, E L Dereniak, F O BartellPageof 3